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A New Generation of Variable Temperature Scanning Probe Microscope for Spectroscopy

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Chomiuk P., Uder B., Bettac A., Köble J., Tröppner C.
Acta Physica Polonica A
|
2014
|
vol. 125
|
issue 4
1049-1051
EN
In this contribution we present the design and first results of a new generation of variable temperature scanning probe microscope that has been developed to enhance the performance in tunnelling spectroscopy at lower temperatures. Its performance has been proven with imaging and spectroscopy experiments on the well known Si(111), Au(111), and Ag(111) surfaces.
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