Acta Physica Polonica A - Volume 125, Issue 4 (2014) - PSJD - Yadda

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Publisher

Institute of Physics, Polish Academy of Sciences

Journal

Acta Physica Polonica A

Year

2014

Volume

125

Issue

4

Identifiers

Cover

Volume contents

4
- article: Proceedings of the XLVIIIth Zakopane School of Physics International Symposium Breaking Frontiers: Submicron Structures in Physics and Biology. Preface., p. 853-859
- article: Influence of Carbon Nanoparticles Morphology on Physical Properties of Polymer Composites (Wróblewski G., Słoma M., Janczak D., Młożniak A., Jakubowska M.), p. 861-863
- article: X-Ray Fluorescence Techniques in Medical Applications: Reference Values of Elements in Human Serum, Urine and Hair (Majewska U., Banaś D., Braziewicz J., Kubala-Kukuś A., Pajek M., Sychowska I., Wudarczyk-Moćko J., Antczak G., Borkowska B., Góźdź S.), p. 864-868
- article: T1 and T2 Relaxation Times from Substantia Nigra in Parkinson's Disease and Control (Kuliński R., Szlachta K., Gałązka-Friedman J., Friedman A.), p. 869-871
- article: Efficiencies of the Copper(II) Adsorbed Zeolites in the H_2O_2 Disproportionation Reaction (Çıçek E., Dede B.), p. 872-874
- article: Studies on Catalase-Like Activity of Some Tc-99m Radiopharmaceuticals (Çıçek E., Dede B.), p. 875-876
- article: Investigation of Infrared and Raman Spectra of TeO_2-Nb_2O_5-TiO_2 Glasses (Kabalci İ., Gökçe H.), p. 877-881
- article: Development of a Soft X-ray Microprobe for Radiobiology Studies (Appuhamilage I., Adjei D., Alatabi S., Alnaimi R., Michette A., Pfauntsch S.), p. 882-885
- article: Interactions between Antitumor Alkylphosphocholines and Membrane Sphingolipids in Langmuir Monolayers (Wnętrzak A., Łątka K., Dynarowicz-Łątka P.), p. 886-890
- article: Magnetic Polymer Nanocomposite for Medical Application (Świętek M., Tokarz W., Tarasiuk J., Wroński S., Błażewicz M.), p. 891-894
- article: Variation of CFCs and SF_6 Concentration in Air of Urban Area, Kraków (Poland) (Bielewski J., Śliwka I.), p. 895-897
- article: Morphological Variations of Chondrocytes in Bovine Articular Cartilage Using Confocal Laser Scanning Microscopy (Çıçek E., Arikanoğlu A.), p. 898-901
- article: Scanning X-ray Microscopy with a Single Photon Counting 2D Detector (Stachnik K., Meents A.), p. 902-906
- article: Molecular Dynamics of Proteins Investigated by NMR Relaxation Methods (Wierzuchowska D., Blicharska B.), p. 907-910
- article: X-ray Diffraction and Elemental Analysis of Medical and Environmental Samples (Bielecka K., Kurtek W., Banaś D., Kubala-Kukuś A., Braziewicz J., Majewska U., Pajek M., Wudarczyk-Moćko J., Stabrawa I.), p. 911-918
- article: Alginate Biopolymer Coatings Obtained by Electrophoretic Deposition on Ti15Mo Alloy (Szklarska M., Dercz G., Simka W., Dudek K., Starczewska O., Łężniak M., Łosiewicz B.), p. 919-923
- article: Polycarbonate Polymer Surface Modification by Extreme Ultraviolet (EUV) Radiation (Ahad I., Budner B., Korczyc B., Fiedorowicz H., Bartnik A., Kostecki J., Burdyńska S., Brabazon D.), p. 924-928
- article: Studies of the Bacterial Surfaces by XPS and SEM Methods (Płoszaj-Pyrek J., Talik E., Piotrowska-Seget Z.), p. 929-931
- article: Electrochemical Formation of Self-Organized Nanotubular Oxide Layers on Ti13Zr13Nb Alloy for Biomedical Applications (Smołka A., Rodak K., Dercz G., Dudek K., Łosiewicz B.), p. 932-935
- article: TiPd Shape Memory Alloy Studied by PAC Method (Kulińska A., Wodniecki P.), p. 936-939
- article: Olefin Hydrogenation with Single-Site Gold (Szlachetko J., Lothschütz C., Sá J.), p. 940-943
- article: Tailored Magnetic and Electric States in 3d-Metal-Insulator Films: Characterization and Applications (Fedotova J.), p. 944-952
- article: Proceedings of the 15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors. Preface., p. 953-955
- article: Parallel Optical Profilometry Assisted Conception of an Opto-Electronic Illuminator Using a VCSEL and Diffractive Optics (Montgomery P., Serio B., Twardowski P.), p. 957-961
- article: Observations of Overlapped Single Shockley Stacking Faults in 4H-SiC PiN Diode (Nakayama K., Hemmi T., Asano K., Miyazawa T., Tsuchida H.), p. 962-964
- article: Development of a Storage Getter Test for Cu Contaminations in Silicon Wafers Based on ToF-SIMS Measurements (Kot D., Kissinger G., Sattler A., Müller T.), p. 965-968
- article: X-Ray Topographic Study of a Homoepitaxial Diamond Layer on an Ultraviolet-Irradiated Precision Polished Substrate (Kato Y., Umezawa H., Shikata S.), p. 969-971
- article: Correlation between Copper Precipitation and Grown-In Oxygen Precipitates in 300~mm Czochralski Silicon Wafer (Dong P., Ma X., Yang D.), p. 972-975
- article: Characterization of Radiation Defect Centers in Neutron Irradiated Si Using Inverse Laplace Transformation to Analysis of Photocurrent Relaxation Waveforms (Kamiński P., Kozłowski R., Żelazko J.), p. 976-981
- article: Electroluminescence Investigation of the Lateral Field Distribution in AlGaN/GaN HEMTs for Power Applications (Baeumler M., Polyakov V., Gütle F., Dammann M., Benkhelifa F., Waltereit P., Reiner R., Müller S., Wespel M., Quay R., Mikulla M., Wagner J., Ambacher O.), p. 982-985
- article: A Structural Characterization of GaAs MBE Grown on Si Pillars (Frigeri C., Bietti S., Scaccabarozzi A., Bergamaschini R., Falub C., Grillo V., Bollani M., Bonera E., Niedermann P., von Känel H., Sanguinetti S., Miglio L.), p. 986-990
- article: Focused Ion Beam Imaging of Defects in Multicrystalline Si for Photovoltaic Application (Miyamura Y., Sekiguchi T., Chen J., Li J., Watanabe K., Kumagai K., Ogura A.), p. 991-993
- article: Observation and Control of Interfacial Defects in ZnO/ZnSe Coaxial Nanowires (Bhutto W., Wu Z., Cao Y., Wang W., Kang J.), p. 994-996
- article: Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces (Marinskiy D., Edelman P., Snider A.), p. 997-1002
- article: Effect of Stress on Defect Transformation in B^{+} and Ag^{+} Implanted HgCdTe/CdZnTe Structures (Savkina R., Smirnov A., Gudymenko A., Kladko V., Sizov F., Frigeri C.), p. 1003-1005
- article: Raman Study of Multicrystalline Silicon Wafers Produced by the RST Process (Tejero A., Tupin E., González M., Martínez O., Jiménez J., Belouet C., Baillis C.), p. 1006-1009
- article: Photoluminescence Analysis of Oxygen Precipitation around Small-Angle Grain Boundaries in Multicrystalline Silicon Wafers (Kato G., Tajima M., Okayama F., Tokumaru S., Sato R., Toyota H., Ogura A.), p. 1010-1012
- article: Residual Strain and Electrical Activity of Defects in Multicrystalline Silicon Solar Cells (Martínez O., Mass J., Tejero A., Moralejo B., Hortelano V., González M., Jiménez J., Parra V.), p. 1013-1016
- article: Electrical Behavior of Mg in Mg-Implanted 4H-SiC Layer (Matsuura H., Morine T., Nagamachi S.), p. 1017-1020
- article: Output Estimation of Concentrator Photovoltaic Using Mappings of Environmental Factors and Performance Ratio (Nomura K., Ota Y., Minemoto T., Nishioka K.), p. 1021-1023
- article: Dislocation Generation and Propagation across the Seed in Seed Cast-Si Ingots (Miyamura Y., Chen J., Prakash R., Jiptner K., Harada H., Sekiguchi T.), p. 1024-1026
- article: Effect of Secondary Electroluminescence on Cathodoluminescence and Other Luminescence Measurements (Pluska M., Czerwinski A., Szerling A., Ratajczak J., Kątcki J.), p. 1027-1032
- article: Investigation on the Mechanisms of Nitrogen Shallow Implantation Influence on Trap Properties of SiO_2/n-Type 4H-SiC Interface (Król K., Sochacki M., Szmidt J.), p. 1033-1037
- article: Defect Analysis of Pentacene Diode (Stuchlíková L., Weis M., Juhász P., Kósa A., Harmatha L., Jakabovic J.), p. 1038-1041
- article: Effect of Deep-Level Defects on Transient Photoconductivity of Semi-Insulating 4H-SiC (Suproniuk M., Kamiński P., Kozłowski R., Pawłowski M.), p. 1042-1048
- article: A New Generation of Variable Temperature Scanning Probe Microscope for Spectroscopy (Chomiuk P., Uder B., Bettac A., Köble J., Tröppner C.), p. 1049-1051
- article: Characterisation of (100) GaSb Passivated Surface Using Next Generation 3D Digital Microscopy (Papis-Polakowska E., Leonhardt E., Kaniewski J.), p. 1052-1055
- article: PeakForce Tapping Technique for Characterization of Thin Organic Passivating Layers (Papis-Polakowska E., Radkowski B., Lesko S., Kaniewski J.), p. 1056-1060
- article: X-Ray Photoelectron Spectroscopy - Methodology and Application (Papis-Polakowska E., White R., Deeks C., Mannsberger M., Krajewska A., Strupinski W., Płocinski T., Jankowska O.), p. 1061-1064
- article: Mapping of Copper Oxidation State Using High Pressure X-Ray Photoelectron Spectroscopy (Kowalska J., Gopinath C.), p. 1065-1066

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