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Study of Photoelectron Emission Yield from Layered Structures in Presence of Resonance-Enhanced X-Ray Propagation Effect

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Pełka J. B., Lagomarsino S., Cedola A., Di Fonzo S., Jark W.
Acta Physica Polonica A
|
1997
|
vol. 91
|
issue 5
851-857
EN
In this work we present the new experimental results of total photoelectric yield as well as energy distribution of photoelectrons excited in a thin carbon film deposited on Ni mirror in the presence of resonance-enhanced X-ray propagation effect. The measurements were performed using conventional X-ray tube as a radiation source for the energy Cu K_{α} (8047 keV). The spectra were recorded using a flow proportional electron counter with energy resolution of about 15%, and multichannel pulse height analyzer. A comparison with the reflectivity spectra recorded at the same time show an excellent correlation of both kinds of spectra, consistently with the theoretical prediction. A map of electron energy distribution is reported. Although the applied electron counter was of low energetic resolution the recorded spectra show characteristic regularities and indicate that the photoelectron yield excited in the presence of resonance-enhanced X-ray propagation effect can provide depth dependent information about impurity distribution and processes in thin layers.
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