Acta Physica Polonica A - Volume 91, Issue 5 (1997) - PSJD - Yadda

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Publisher

Institute of Physics, Polish Academy of Sciences

Journal

Acta Physica Polonica A

Year

1997

Volume

91

Issue

5

Identifiers

Cover

Volume contents

5
- article: Partial Probabilities of X-Ray Bremsstrahlung Transitions (Nietubyć R., Sobczak E., S̆imůnek A., Vackár̆ J., S̆ipr O.), p. 841-846
- article: Resonant Photoemission Study of Sn_{0.96}Gd_{0.04}Te (Orlowski N., Janowitz C., Müller A., Manzke R., Kowalski B. J., Orłowski B. A.), p. 847-850
- article: Study of Photoelectron Emission Yield from Layered Structures in Presence of Resonance-Enhanced X-Ray Propagation Effect (Pełka J. B., Lagomarsino S., Cedola A., Di Fonzo S., Jark W.), p. 851-857
- article: Grazing Incidence X-Ray Reflectivity Study of MBE-Grown Co/Cu Multilayers (Pełka J. B., Baczewski L. T., Wawro A., Domagała J.), p. 859-863
- article: Comparative Study of Si-2p Core-Excitation Spectra of SiX_{4} Molecules (with X = H, D, F, Cl, Br) (Püttner R., Domke M., Kaindl G.), p. 865-870
- article: Determination by X-Ray Absorption of Redox Induced Structural Changes in Iron-Sulfur Cluster F_{x} in Photosystem I (Sagi I., Bunker G., Hochman Y., Carmeli C., Zeng M. T.), p. 871-875
- article: C_{60}FeC_{60} Complexes in Fe Intercalated Fullerite Studied by X-Ray Absorption (Sobczak E., Traverse A., Nietubyć R., Swilem Y., Byszewski P., Żymierska D.), p. 877-881
- article: X-Ray Absorption Studies of Fe_{73.5}Cu_{1}Nb_{3}Si_{15.5}B_{7} Amorphous and Nanocrystalline Alloys (Swilem Y., Sobczak E., Nietubyć R., Ślawska-Waniewska A., Dynowska E.), p. 883-886
- article: Photoemission by Polarized X-Rays (Tilinin I. S.), p. 887-892
- article: Measurement of Infrared Transition Spectrum of Synchrotron Radiation Through Superconducting YBa_{2}Cu_{3}O_{7-δ} Film (Tyutyunnikov S. I., Shaliapin V. N., Scintee N.), p. 893-897
- article: Solid-State Solutions of TiO_{2}-SnO_{2} and SrTiO_{3}-BaTiO_{3} (Zakrzewska K., Radecka M., Pasierb P., Bućko M., Urbaniec E., Janas J.), p. 899-903
- article: Study of Si(111) Implanted with As Ions by X-Ray Diffraction and Grazing Incidence Methods (Pełka J. B., Górecka J., Auleytner J., Domagała J., Bąk-Misiuk J.), p. 905-910
- article: Effect of Doping on Ga_{1-x}Al_{x}As Structural Properties (Bąk-Misiuk J., Domagała J., Paszkowicz W., Trela J., Żytkiewicz Z. R., Leszczyński M., Regiński K., Muszalski J., Härtwig J., Ohler M.), p. 911-917
- article: Structure Refinement of Amorphous Cd-As by Analysis of Partial Radial Distribution Functions (Burian A.), p. 917-921
- article: Photoelectron Emission Microscopy and its Application to the Study of Polymer Surfaces (Cossy-Favre A., Diaz J., Anders S., Padmore H., Liu Y., Samant M., Stöhr J., Brown H., Russell T. P.), p. 923-927
- article: Structural Perfection of Czochralski Grown Silicon Crystals Annealed above 1500 K under Hydrostatic Pressure (Datsenko L., Khrupa V., Krasulya S., Misiuk A., Härtwig J., Surma B.), p. 929-933
- article: Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum (Datsenko L., Krasulya S., Machulin V., Auleytner J., Khrupa V.), p. 935-938
- article: High Pressure - High Temperature Diffraction Study of MnTe Using Synchrotron Radiation (Paszkowicz W., Dynowska E., Peun T.), p. 939-944
- article: X-Ray Lasers, Operation and Applications (Fiedorowicz H.), p. 945-951
- article: X-Ray Diffraction and NMR Studies on Mixtures of Non-Ionic Surfactant (C_{12}EO_{2}) and Phospholipids (POPC) (Funari S. S., di Vitta C., Rapp G.), p. 953-960
- article: Optimization of Azimuthal Scan Procedure for Absolute Structure Determination (Grochowski J., Serda P.), p. 961-968
- article: Solid State Ion Exchange Reactions of Co with Zeolites (Jentys A., Lugstein A., Vinek H.), p. 969-974
- article: X-MCD Study of Expanded Lattice Permanent Magnet Materials (Kapusta C., Mycielski R., Porębska B., Ahlers D., Attenkofer K., Fischer P., Schütz G.), p. 975-979
- article: X-Ray Structure Perfection Diagnostics of Slightly Distorted Silicon Crystals in the Bragg Case of Diffraction (Khrupa V., Krasulya S., Machulin V., Datsenko L., Auleytner J.), p. 981-985
- article: Defect Structure of Pressure Treated Czochralski Grown Silicon Investigated by X-Ray Topography and Diffractometry (Misiuk A., Härtwig J., Prieur E., Ohler M., Bąk-Misiuk J., Domagała J., Surma B.), p. 987-991
- article: High-Pressure Diffraction Study of Ga_{1-x}Al_{x}As (Paszkowicz W., Dynowska E., Żytkiewicz Z. R., Dobosz D., Otto J. W.), p. 993-996
- article: X-Ray Characterization of GaAs:Zn Gas-transport Grown Whiskers Using Conventional and Synchrotron Sources (Paszkowicz W., Górecka J., Domagała J., Dmitruk N., Varshava S. S., Härtwig J., Ohler M., Pietraszko A.), p. 997-1002
- article: Physical Properties of AlGaAs Epilayers Subjected to High Pressure - High Temperature Treatment (Szuszkiewicz W., Gębicki W., Bąk-Misiuk J., Domagała J., Leszczyński M., Hartwig J.), p. 1003-1007
- article: Scanning Force Microscopy on Laser Ablated Silicon Nitride Films (Vrînceanu C., Flueraru C., Dinescu M., Vasile E.), p. 1009-1014
- article: Synchrotron White Beam Topographic Studies of Gallium Arsenide Crystals (Wierzchowski W., Wieteska K., Graeff W.), p. 1015-1019
- article: Interference Fringes in Synchrotron Section Topography of Implanted Silicon with a Very Large Ion Range (Wieteska K., Wierzchowski W., Graeff W., Dłużewska K.), p. 1021-1024
- article: Comparative Studies of Surface Roughness of Thin Epitaxial Si Films by Computer Simulations and Experimental X-Ray and Optical Methods (Żymierska D., Auleytner J., Domagała J., Szewczyk A., Dmitruk N.), p. 1025-1030

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