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The Effect of Different Organic Gelating Agents on Grain Size of ZnO Nanoparticles

100%
Karaal Ş., Köse H., Aydin A., Akbulut H.
Acta Physica Polonica A
|
2014
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vol. 125
|
issue 2
338-340
EN
In this work, sol-gel method was used in order to synthesize ZnO nanoparticles. Zn(CH_3COO)_2 ·2H_2O was used to obtain ZnO precursor solution. To investigate the effect of organic gelating agents on grain size, various organic gelating agents such as triethanolamine (TEA), glycerin (GLY), ethylene glycol (EG), citric acid (CA) and tartaric acid (TA) were used. X-ray diffraction analysis was used for phase identification and grain size calculation. ZnO powders were characterized by using Fourier-transform infrared spectroscopy, scanning electron microscopy and atomic force microscopy.
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The Effect of Temperature on Grain Size of SnO_2 Nanoparticles Synthesized by Sol-Gel Method

100%
Köse H., Aydin A., Akbulut H.
Acta Physica Polonica A
|
2014
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vol. 125
|
issue 2
345-347
EN
Tin dioxide nanoparticles were synthesized by sol-gel method and calcined at different temperatures in the range 350-750°C. The SnO_2 precursor solution was prepared from SnCl_2 ·2H_2O (tin (II) chloride dihydrate), and chloride ions were removed from the solution before the sol-gel synthesis was applied. SnO_2 powders were characterized by thermal analyses, X-ray diffraction, field emission gun-scanning electron microscopy, and energy dispersive X-ray spectroscopy, and grain size of nanoparticles were determined by using the Debye-Scherrer formula.
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Sol-Gel Synthesis of Nanostructured SnO_2 Thin Film Anodes for Li-Ion Batteries

100%
Köse H., Aydin A., Akbulut H.
Acta Physica Polonica A
|
2012
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vol. 121
|
issue 1
227-229
EN
Sol-gel technique was employed to prepare semiconductor tin dioxide (SnO_2) thin films. Comparatively, it gives an advantage over other techniques by its low reaction temperature, easy process and low cost. The effect of glycerin addition on the structure and preventing crack formation has been investigated. Scanning electron microscopy, atomic force microscopy, and X-ray diffraction analysis were performed to characterize nanostructured films.
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