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Thin films of TiO_{2}-SnO_{2} and SrTiO_{3}-BaTiO_{3} are deposited by rf sputtering. The crystallographic and optical properties near the band gap absorption are investigated as a function of film composition. Systematic displacement of the fundamental absorption edge shows different behaviour for amorphous and polycrystalline samples. Results are discussed in terms of the influence of the substitution on the local environment of Ti ion and Me-O distances. Application of XANES and EXAFS is proposed for the studies of solid-state solutions.
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