This paper demonstrates the analysis of defect states in pentacene film sandwiched between Au and Al electrodes by the deep-level transient spectroscopy method. Three hole-like deep energy levels were observed. The effective mass obtained from the simulation is applied and defect parameters, namely the capture cross-sections and the activation energy 3.7 × 10^{-18} cm^2 at 0.34 eV, 3.1 × 10^{-17} cm^2 at 0.41 eV, and 2.9 × 10^{-15} cm^2 at 0.63 eV is determined from the Arrhenius plot. Reliability of obtained defect parameters is confirmed by simulation of deep level transient spectra and comparison with experiment.
We report on an incorporation of self-assembled templates of superparamagnetic Fe-O nanoparticles into tunnel magnetoresistance devices. We fabricated a multilayer stack composed of the following layer sequence: Cr/Au/Co/NP/Co/Cu on Si(100) substrate where NP stands for a self-assembled layer of nanoparticles deposited by the Langmuir-Blodgett technique. The X-ray reflectivity and grazing-incidence small angle X-ray scattering were employed to study the layers thicknesses and interface morphology in each preparation step. In particular, the grazing-incidence small angle X-ray scattering was measured before and after the nanoparticle incorporation as well as on the complete tunnel magnetoresistance stack. In this way, in-depth morphology profile during subsequent preparation steps was obtained. We demonstrate that X-ray analysis of the deposited tunnel magnetoresistance stack is essential for successful fabrication of novel hybrid devices consisting of self-assembled nanoparticles.
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