Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl
Preferences help
Polish version English version Language
enabled [disable] Abstract
Number of results

Results found: 2

Number of results on page
first rewind previous Page / 1 next fast forward last

Search results

help Sort By:

help Limit search:
first rewind previous Page / 1 next fast forward last
1
Publication available in full text mode
Content available

The implementation and the performance analysis of the multi-channel software-based lock-in amplifier for the stiffness mapping with atomic force microscope (AFM)

100%
Sikora A., Bednarz Ł.
Bulletin of the Polish Academy of Sciences: Technical Sciences
|
2012
|
issue 1
2
Content available remote

Utilization of Digital Processing of the Optical Scanning Field View for Tip-Sample Distance Estimation during the Approach Procedure

100%
Sikora A., Bednarz Ł.
Acta Physica Polonica A
|
2009
|
vol. 116
|
issue S
S-99-S-101
EN
In this article we present the method of determining the tip-sample distance using advanced data processing of scanning field's optical picture. This feature can reduce both: the approach process time and the risk of damaging the tip or the sample. Experimental results will be also presented.
first rewind previous Page / 1 next fast forward last
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.