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Publisher
Institute of Physics, Polish Academy of Sciences
Journal
Acta Physica Polonica A
Year
2009
Volume
116
Issue
S
Identifiers
Cover
Volume contents
S
article:
Monte Carlo Studies of Quantum Cascade Lasers
(
Borowik P.
,
Thobel J.
,
Bugajski M.
,
Adamowicz L.
), p. S-49-S-51
article:
Determination of the Analytical Relationship between Refractive Index and Density of SiO_{2} Layers
(
Rzodkiewicz W.
,
Panas A.
), p. S-92-S-94
article:
LT-InGaAs Layer Grown for Near Surface SESAM Application
(
Jasik A.
,
Muszalski J.
,
Kosmala M.
,
Pierściński K.
), p. S-56-S-59
article:
Mid-Infrared GaAs/AlGaAs Quantum Cascade Lasers Technology
(
Szerling A.
,
Karbownik P.
,
Kosiel K.
,
Kubacka-Traczyk J.
,
Pruszyńska-Karbownik E.
,
Płuska M.
,
Bugajski M.
), p. S-45-S-47
article:
The Study of Thermal Properties of GaAs/AlGaAs Quantum Cascade Lasers
(
Pruszyńska-Karbownik E.
,
Karbownik P.
,
Szerling A.
,
Kosiel K.
,
Bugajski M.
), p. S-60-S-61
article:
Optical Analyses of Si and GaAs Semiconductors by Fractional-Derivative-Spectrum Methods
(
Rzodkiewicz W.
,
Kulik M.
,
Papis E.
,
Szerling A.
), p. S-95-S-98
article:
Extension of Usable Spectral Range of Peltier Cooled Photodetectors
(
Piotrowski A.
,
Piotrowski J.
,
Gawron W.
,
Pawluczyk J.
,
Pedzinska M.
), p. S-52-S-55
article:
Utilization of the Electrostatic Force Microscopy for Detection Filler Grains in Nanocomposites
(
Sikora A.
), p. S-102-S-104
article:
Utilization of Digital Processing of the Optical Scanning Field View for Tip-Sample Distance Estimation during the Approach Procedure
(
Sikora A.
,
Bednarz Ł.
), p. S-99-S-101
article:
Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current
(
Pluska M.
,
Czerwinski A.
,
Ratajczak J.
,
Szerling A.
,
Kątcki J.
), p. S-86-S-88
article:
Analysis of Interaction of Surfactant Molecules with Si(hkl) Planes on the Basis of Anisotropic Etching in Alkaline Solutions
(
Zubel I.
,
Kramkowska M.
), p. S-105-S-107
article:
Formation of Excess Silicon on 6H-SiC(0001) during Hydrogen Etching
(
Grodzicki M.
,
Wasielewski R.
,
Surma S.
,
Ciszewski A.
), p. S-82-S-85
article:
Normal Force Calibration Method Used for Calibration οf Atomic Force Microscope
(
Ekwińska M.
,
Rymuza Z.
), p. S-78-S-81
article:
TEM Characterization of Polysilicon and Silicide Fin Fabrication Processes of FinFETs
(
Ratajczak J.
,
Łaszcz A.
,
Czerwinski A.
,
Kątcki J.
,
Tang X.
,
Reckinger N.
,
Yarekha D.
,
Larrieu G.
,
Dubois E.
), p. S-89-S-91
article:
Creation of Nanostructures on Polymer Surfaces Irradiated with Extreme Ultraviolet Pulses
(
Bartnik A.
,
Fiedorowicz H.
,
Jarocki R.
,
Kostecki J.
,
Szczurek A.
,
Szczurek M.
), p. S-108-S-110
article:
Silica-Titania Films Fabricated by Sol-Gel Method for Applications in Planar Photonics
(
Karasiński P.
), p. S-114-S-116
article:
Light Emission from CdS Quantum Dots Stabilized by Sugars
(
Sergiel I.
,
Mirończyk A.
,
Kozioł J.
,
Defort A.
), p. S-166-S-168
article:
Biological Synthesis of Gold Nanostructures Using the Extract of Trichoderma koningii
(
Maliszewska I.
,
Aniszkiewicz Ł.
,
Sadowski Z.
), p. S-163-S-165
article:
The Influence of the Chemical Compounds οn the Zinc Oxide Nanostructures Growth in Chemical Bath Deposition
(
Byrczek M.
,
Malewicz M.
,
Halek G.
,
Teterycz H.
), p. S-111-S-113
article:
Antibacterial Properties of Polyester Fibres' Materials with Titanium Dioxide Deposited on Their Surface
(
Karbownik I.
,
Kowalczyk D.
,
Malinowska G.
,
Paruch B.
), p. S-169-S-171
article:
Ultrapure Water for Elemental Analysis Down to ppt Levels
(
Darbouret D.
,
Kano I.
), p. S-203-S-205
article:
The Kinetics of Ethylene Decomposition on Iron Catalyst
(
Pełech I.
,
Narkiewicz U.
), p. S-146-S-149
article:
Combustion Formation of Novel Nanomaterials: Synthesis and Cathodoluminescence of Silicon Carbide Nanowires
(
Savchyn V.
,
Karbovnyk I.
,
Popov A.
,
Huczko A.
), p. S-142-S-145
article:
AFM Force Spectroscopy and Steered Molecular Dynamics Simulation of Protein Contactin 4
(
Strzelecki J.
), p. S-156-S-159
article:
Extracellular Biosynthesis and Antimicrobial Activity οf Silver Nanoparticles
(
Maliszewska I.
,
Puzio M.
), p. S-160-S-162
article:
Effect of the Silanization Processes on the Properties οf Oxidized Multiwalled Carbon Nanotubes
(
Scheibe B.
,
Borowiak-Palen E.
,
Kalenczuk R.
), p. S-150-S-155
article:
Scaling Fabrication Methods from Micro to Nano
(
Cooke M.
), p. S-201-S-202
article:
Plasmon Enhancement of Fluorescence in Single Light-Harvesting Complexes from em Amphidinium carterae
(
Bujak Ł.
,
Piątkowski D.
,
Mackowski S.
,
Wörmke S.
,
Jung C.
,
Bräuchle C.
,
Agarwal A.
,
Kotov N.
,
Schulte T.
,
Hofmann E.
,
Brotosudarmo T.
,
Scheer H.
,
Govorov A.
,
Hiller R.
), p. S-22-S-25
article:
Planar Optical Waveguide Sensor Structures with Grating Couplers
(
Karasiński P.
), p. S-30-S-32
article:
Properties of Nanocrystalline TiO_{2}:V Thin Films as a Transparent Semiconducting Oxides
(
Sieradzka K.
,
Domaradzki J.
,
Prociow E.
,
Mazur M.
,
Lapinski M.
), p. S-33-S-35
article:
Investigation of the Stress in MOS Structures with Micro-Raman Scattering
(
Borowicz P.
,
Borowicz L.
,
Brzezińska D.
), p. S-42-S-44
article:
Barriers in Miniaturization of Electronic Devices and the Ways to Overcome Them - from a Planar to 3D Device Architecture
(
Godlewski M.
,
Guziewicz E.
,
Gierałtowska S.
,
Łuka G.
,
Krajewski T.
,
Wachnicki Ł.
,
Kopalko K.
), p. S-19-S-21
article:
Analysis of the Experimental Data from MOS Structures in the Case of Large Noise-to-Signal Ratio
(
Borowicz L.
,
Borowicz P.
,
Rzodkiewicz W.
), p. S-26-S-29
article:
Quantum Dashes and Quantum Rods: Optical Properties and Application Prospects
(
Sęk G.
), p. S-36-S-41
article:
Spin in CdTe/ZnTe Quantum Dot: Its Potential for Information Storage
(
Kazimierczuk T.
), p. S-13-S-18
article:
Single Electron Spin Operations Employed for Logical Gates of Quantum Computer
(
Bednarek S.
,
Dudek R.
), p. S-7-S-12
article:
Proceedings of the 3rd National Conference on Nanotechnology NANO 2009. Preface.
, p. S-3-S-6
article:
Porous Silicon Formation by Metal-Assisted Chemical Etching
(
Lipinski M.
,
Cichoszewski J.
,
Socha R.
,
Piotrowski T.
), p. S-117-S-119
article:
The Influence of Ion Implantation on the Optical Parameters - Refraction and Extinction Coefficients οf the Oxygen-Enriched Layers Covering GaAs Implanted with Indium Ions
(
Rzodkiewicz W.
,
Kulik M.
,
Pyszniak K.
,
Kobzev A.
), p. S-129-S-132
article:
Gasochromic Effect in Nanocrystalline TiO_{2} Thin Films Doped with Ta and Pd
(
Domaradzki J.
,
Prociow E.
,
Kaczmarek D.
,
Wojcieszak D.
,
Gatner D.
,
Lapinski M.
), p. S-126-S-128
article:
Characteristics of Carbon Films Deposited by Magnetron Sputtering
(
Mróz W.
,
Burdyńska S.
,
Prokopiuk A.
,
Jedyński M.
,
Budner B.
,
Korwin-Pawlowski M.
), p. S-120-S-122
article:
Carbon Deposit Formation in Normal-Pressure Electrical Discharges in Hydrocarbons
(
Sobczyk A.
,
Jaworek A.
), p. S-136-S-138
article:
Influence of AlN Buffer Layer Deposition Temperature οn Properties of GaN HVPE Layers
(
Prażmowska J.
,
Korbutowicz R.
,
Wośko M.
,
Paszkiewicz R.
,
Kovač J.
,
Srnanek R.
,
Tłaczała M.
), p. S-123-S-125
article:
Nanoscale Pattern Definition by Edge Oxidation of Silicon under the Si_{3}N_{4} mask - PaDEOx
(
Zaborowski M.
,
Grabiec P.
,
Dobrowolski R.
,
Panas A.
,
Skwara K.
,
Szmigiel D.
,
Wzorek M.
), p. S-139-S-141
article:
Synthesis and Characterization of ZnO Doped with Fe_{2}O_{3} - Hydrothermal Synthesis and Calcination Process
(
Sibera D.
,
Jędrzejewski R.
,
Mizeracki J.
,
Presz A.
,
Narkiewicz U.
,
Łojkowski W.
), p. S-133-S-135
article:
NT-MDT - Integrated Solutions for Nanotechnology
(
Mościcki I.
,
Kaszyński G.
), p. S-172-S-173
article:
Visualisation of Wear Debris from Orthopaedic Implants
(
Brzana A.
), p. S-174-S-175
article:
Characterization of Transparent and Nanocrystalline TiO_{2}:Nd Thin Films Prepared by Magnetron Sputtering
(
Domaradzki J.
,
Wojcieszak D.
,
Prociow E.
,
Kaczmarek D.
), p. S-75-S-77
article:
Electronic States in Type-II Superlattices
(
Machowska-Podsiadlo E.
,
Bugajski M.
), p. S-65-S-68
article:
Microscopic Investigation of SiC Epitaxial Layers οn On-Axis 4H-SiC Substrates Using Kelvin Probe Force Microscopy
(
Kościewicz K.
,
Bożek R.
,
Strupiński W.
,
Olszyna A.
), p. S-69-S-71
article:
Thin Films Based on Nanocrystalline TiO_{2} for Transparent Electronics
(
Prociow E.
,
Sieradzka K.
,
Domaradzki J.
,
Kaczmarek D.
,
Mazur M.
), p. S-72-S-74
article:
Structural and Optical Properties of Antimony-Containing Epitaxial Layers Grown on GaSb by MOCVD
(
Wesołowski M.
,
Strupiński W.
), p. S-62-S-64
article:
Measurements of Surface Properties in the Nano- and Microscale Using Optical, Mechanical, and Scanning Probe Methods
(
Rok Ł.
), p. S-180-S-183
article:
Nanonics MultiView - Near-Field Scanning Microscopy and Imaging without Compromise
(
Khvorostov A.
), p. S-184-S-186
article:
Full Field Nanoimprint on Mask Aligners Using Substrate Conformal Imprint Lithography Technique
(
Ji R.
,
Krüger A.
,
Hornung M.
,
Verschuuren M.
,
van de Laar R.
,
van Eekelen J.
), p. S-187-S-189
article:
RIBER Compact 21: the World Best Seller Molecular Beam Epitaxy System
(
Tarde C.
), p. S-176-S-179
article:
3D Laser Microscopy for Nanotechnology and Metrology
(
Yatsunenko S.
,
Fabich M.
), p. S-194-S-195
article:
Raith - Electron Beam Lithography for Research
(
Kirchner M.
,
Kahl M.
), p. S-198-S-200
article:
Characterization of Heterogeneous Materials with the Confocal Raman AFM
(
Vargas F.
,
Schmidt U.
), p. S-190-S-191
article:
Non-Destructive Characterization, Inspection, Failure Analysis of Advanced Components and Sensors with a High Resolution and High Contrast Micro XCT System
(
Lau S.
,
Kowalczyk A.
), p. S-192-S-193
article:
The 56xx Desktop Micro Factory - the New Equipment for Wire-Bond Technologies
(
Sedlmair J.
,
Berger S.
), p. S-196-S-197
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