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1998 | 94 | 3 | 545-548
Article title

Electrical Characterization of Semiconducting Polymers

Content
Title variants
Languages of publication
EN
Abstracts
EN
Schottky diodes resulting from an intimate contact of aluminum on electrodeposited poly(3-methylthiopene) were studied by admittance spectroscopy, capacitance-voltage measurements and voltaic and optically-induced current and capacitance transients. The loss tangents show the existence of interface states that can be removed by vacuum annealing. Furthermore, the C-V curves contradict the idea of movement of the dopant ions.
Keywords
EN
Year
Volume
94
Issue
3
Pages
545-548
Physical description
Dates
published
1998-09
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv94z338kz
Identifiers
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