Electrical Characterization of Semiconducting Polymers

• Authors: P. Stallinga , H. Gomes , G. Jones , D. Taylor
• Languages of publication: EN

Abstracts

EN

Schottky diodes resulting from an intimate contact of aluminum on electrodeposited poly(3-methylthiopene) were studied by admittance spectroscopy, capacitance-voltage measurements and voltaic and optically-induced current and capacitance transients. The loss tangents show the existence of interface states that can be removed by vacuum annealing. Furthermore, the C-V curves contradict the idea of movement of the dopant ions.

Keywords

EN

73.61.Ph; 73.40.-c

Discipline

• 73.40.-c: Electronic transport in interface structures
• 73.61.Ph: Polymers; organic compounds

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1998
• Volume: 94
• Issue: 3
• Pages: 545-548

Dates

published

1998-09

Contributors

author

P. Stallinga

• UCEH, Universidade do Algarve, Campus de Gambelas, 8000 Faro, Portugal

author

H. Gomes

• UCEH, Universidade do Algarve, Campus de Gambelas, 8000 Faro, Portugal

author

G. Jones

• Inst. of Molecular and Biomol. Electronics, Univ. of Wales, Dean Street, Bangor, Gwynnedd, LL57 1UT, United Kingdom

author

D. Taylor

• Inst. of Molecular and Biomol. Electronics, Univ. of Wales, Dean Street, Bangor, Gwynnedd, LL57 1UT, United Kingdom

Identifiers

DOI

10.12693/APhysPolA.94.545