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1997 | 91 | 5 | 981-985
Article title

X-Ray Structure Perfection Diagnostics of Slightly Distorted Silicon Crystals in the Bragg Case of Diffraction

Content
Title variants
Languages of publication
EN
Abstracts
EN
A new approach to structure perfection diagnostics of dislocation-free silicon crystals has been developed using the Bragg case of diffraction. The approach is being based on successive measurements of integral reflectivity and the spatial intensity distribution of reflected beam on the same diffraction planes of a real crystal by means of a single crystal diffractometer.
Keywords
EN
Year
Volume
91
Issue
5
Pages
981-985
Physical description
Dates
published
1997-05
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv91z524kz
Identifiers
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