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1992 | 81 | 2 | 303-308

Article title

Analysis of Charge Versus the Surface Fermi Level Position at Silicon Surface

Authors

Content

Title variants

Languages of publication

EN

Abstracts

EN
The surface charge Q_{sc} versus the surface Fermi level position Φ_{s} for real (111) surfaces of p- and n-type Si has been studied. The values of Q_{sc} have been obtained on the basis of measurements of the surface potential V_{s} by means of the surface photo voltage method. The complementary character of Q_{sc}(Φ_{s}) dependences for the surfaces of p- and n-type Si supports the fact that the surface state distribution is not dependent on the type of bulk doping but on the surface preparation process.

Keywords

EN

Year

Volume

81

Issue

2

Pages

303-308

Physical description

Dates

published
1992-02
received
1991-05-21
(unknown)
1991-07-15

Contributors

author
  • Institute of Physics, Silesian Technical University, Krzywoustego 2, 44-100 Gliwice, Poland

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv81z215kz
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