Model of Anisotropic Electrical Resistivity in Rough Thin Films

• Authors: T. Szumiata , M. Gzik-Szumiata
• Languages of publication: EN

Abstracts

EN

In this work a new model of electrical resistivity is proposed in order to study the relationship between surface roughness geometry and thin films resistivity. The model is based on the numerical dynamic averaging of electron mean free path over whole simulated structure of rough film. For current-in-plane configuration the resistivity increases with decreasing film thickness faster than for current-perpendicular-to-plane one. Our simulations showed that big roughness depth and fine in-plane spatial period of roughness are crucial factors increasing the resistivity of ultrathin metallic layers.

Keywords

EN

73.50.-h; 73.61.At; 73.23.Ad; 75.70.Ak; 75.47.-m

Discipline

• 75.47.-m: Magnetotransport phenomena; materials for magnetotransport(for spintronics, see 85.75.-d; see also 72.25.-b Spin polarized transport; 72.15.Gd Galvanomagnetic and other magnetotransport effects; for magnetotransport effects in thin films, see 73.50.Jt; see also 73.43.Qt Magnetoresistance)
• 75.70.Ak: Magnetic properties of monolayers and thin films
• 73.23.Ad: Ballistic transport
• 73.50.-h: Electronic transport phenomena in thin films(for electronic transport in mesoscopic systems, see 73.23.-b; see also 73.40.-c Electronic transport in interface structures; for electronic transport in nanoscale materials and structures, see 73.63.-b)
• 73.61.At: Metal and metallic alloys

• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 118
• Issue: 5
• Pages: 859-860

Dates

published

2010-11

Contributors

author

T. Szumiata

• Department of Physics, Technical University of Radom, I. Krasickiego 54, 26-600 Radom, Poland

author

M. Gzik-Szumiata

• Department of Physics, Technical University of Radom, I. Krasickiego 54, 26-600 Radom, Poland

References

• 1. K. Fuchs, Proc. Cambridge Philos. Soc. 34, 100 (1938)
• 2. E.H. Sondheimer, Adv. Phys. 1, 1 (1952)
• 3. T. Szumiata, M. Gzik-Szumiata, K. Brzózka, Mater. Sci. Poland 26, 1039 (2008)
• 4. T. Szumiata, M. Gzik-Szumiata, K. Brzózka, Acta Phys. Superfic. 11, 126 (2009)
• 5. J.S. Jin, J.S. Lee, O. Kwon, Appl. Phys. Lett. 92, 171910 (2008)
• 6. A.F. Mayadas, M. Shatzkes, Phys. Rev. B 1, 1382 (1970)

Identifiers

DOI

10.12693/APhysPolA.118.859