PL EN


Preferences help
enabled [disable] Abstract
Number of results
2010 | 118 | 4 | 570-575
Article title

Interface Properties of Single and Bi-Layer Fe_3O_4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments

Content
Title variants
Languages of publication
EN
Abstracts
EN
Series of Fe_3O_4/MgO(001) and Fe_3O_4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20 ÷ 150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He^{+} ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He^{+} ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.
Keywords
Contributors
author
  • Institute of Physics, Pedagogical University, Podchorążych 2, 30-084 Kraków, Poland
author
  • Institute of Materials Science, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt, Germany
author
  • Institute of Materials Science, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt, Germany
author
  • Faculty of Physics and Applied Computer Science, University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland
  • European Synchrotron Radiation Facility, 38043 Grenoble, France
author
  • Faculty of Physics and Applied Computer Science, University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland
  • Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences, 30-239 Kraków, Poland
References
  • 1. N. Tsuda, K. Nasu, Y. Yanase, K. Siratori, in: Electronic Conductions in Oxides, Eds: M. Cardona, P. Fulde, K. von Klitzing, H.-J. Queisser, Vol. 94, Springer-Verlag Series in Solid-State Sciences, Springer, Berlin 1990
  • 2. G. Subías, J. García, J. Blasco, Phys. Rev. B 71, 155103 (2005) and references therein
  • 3. S.F. Ceballos, G. Mariotto, K. Jordan, S. Murphy, C. Seoighe, I.V. Shvets, Surf. Sci. 548, 106 (2004)
  • 4. N. Spiridis, J. Barbasz, Z. Łodziana, J. Korecki, Phys. Rev. B 74, 155423 (2006) and references therein
  • 5. M. Zajac, D. Aernout, K. Freindl, K. Matlak, N. Spiridis, M. Slezak, T. Slezak, J. Korecki, Acta Phys. Pol. A 112, 1319 (2007)
  • 6. N.-T.H. Kim-Ngan, A.G. Balogh, J.D. Meyer, J. Brötz, S. Hummelt, M. Zając, T. Ślęzak, J. Korecki, Surf. Sci. 602, 2358 (2008)
  • 7. N.-T.H. Kim-Ngan, A.G. Balogh, J.D. Meyer, J. Brötz, M. Zając, T. Ślęzak, J. Korecki, Surf. Sci. 603, 1175 (2009)
  • 8. SRIM2008 developed by J.F. Ziegler, M.D. Ziegler, J.P. Biersack, http://www.srim.org
  • 9. M. Mayer, AIP Conf. Proc. 475, 541 (1999); SIMNRA (Simulation program for the analysis of NRA, RBS and ERDA), http://www.rzg.mpg.de/~mam/
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv118n408kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.