Interface Properties of Single and Bi-Layer Fe_3O_4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments

• Authors: N. Kim-Ngan , A. Balogh , J. Brötz , M. Zając , J. Korecki
• Languages of publication: EN

Abstracts

EN

Series of Fe_3O_4/MgO(001) and Fe_3O_4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20 ÷ 150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He^{+} ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He^{+} ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.

Keywords

EN

34.35.+a; 68.35.Ct; 68.35.Fx; 68.47.Gh

Discipline

• 68.47.Gh: Oxide surfaces
• 68.35.Ct: Interface structure and roughness
• 68.35.Fx: Diffusion; interface formation(see also 66.30.-h Diffusion in solids, for diffusion of adsorbates, see 68.43.Jk)
• 34.35.+a: Interactions of atoms and molecules with surfaces(see also 79.77.+g Coulomb explosion)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 118
• Issue: 4
• Pages: 570-575

Dates

published

2010-10

received

2010-08-05

Contributors

author

N. Kim-Ngan

• Institute of Physics, Pedagogical University, Podchorążych 2, 30-084 Kraków, Poland

author

A. Balogh

• Institute of Materials Science, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt, Germany

author

J. Brötz

• Institute of Materials Science, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt, Germany

author

M. Zając

• Faculty of Physics and Applied Computer Science, University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland
• European Synchrotron Radiation Facility, 38043 Grenoble, France

author

J. Korecki

• Faculty of Physics and Applied Computer Science, University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland
• Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences, 30-239 Kraków, Poland

References

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• 6. N.-T.H. Kim-Ngan, A.G. Balogh, J.D. Meyer, J. Brötz, S. Hummelt, M. Zając, T. Ślęzak, J. Korecki, Surf. Sci. 602, 2358 (2008)
• 7. N.-T.H. Kim-Ngan, A.G. Balogh, J.D. Meyer, J. Brötz, M. Zając, T. Ślęzak, J. Korecki, Surf. Sci. 603, 1175 (2009)
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Identifiers

DOI

10.12693/APhysPolA.118.570