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2007 | 112 | 6 | 1249-1257
Article title

X-ray Reflectivity and Polarized Neutron Reflectivity Investigations of [Co_ 60 Fe_ 60 B_ 20 /MgO]_n Multilayers

Content
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EN
Abstracts
EN
In recent years magnetic tunnel junctions have been intensively studied and incorporated in magnetic random access memory devices and magnetic sensors, where large tunnelling magnetoresistance ratios are preferred. The largest tunnelling magnetoresistance values until now have been observed in magnetic tunnel junctions with MgO barriers and CoFeB electrodes after annealing of the junction above the recrystallization temperature of the amorphous CoFeB layers. We used X-ray reflectivity and polarized neutron reflectivity to study [Co_ 60 Fe_ 60 B_ 20 /MgO]_ x14 multilayers with the MgO layers prepared by different methods and annealed at different temperatures in order to compare the interface quality and the structural changes induced upon annealing.
Keywords
EN
Year
Volume
112
Issue
6
Pages
1249-1257
Physical description
Dates
published
2007-12
received
2007-07-04
Contributors
author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • INESC-Microsystems and Nanotechnologies, Rua Alves Redol 9, 1000- 029 Lisboa, Portugal
author
  • INESC-Microsystems and Nanotechnologies, Rua Alves Redol 9, 1000- 029 Lisboa, Portugal
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv112n610kz
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