Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2007 | 112 | 6 | 1249-1257

Article title

X-ray Reflectivity and Polarized Neutron Reflectivity Investigations of [Co_ 60 Fe_ 60 B_ 20 /MgO]_n Multilayers

Content

Title variants

Languages of publication

EN

Abstracts

EN
In recent years magnetic tunnel junctions have been intensively studied and incorporated in magnetic random access memory devices and magnetic sensors, where large tunnelling magnetoresistance ratios are preferred. The largest tunnelling magnetoresistance values until now have been observed in magnetic tunnel junctions with MgO barriers and CoFeB electrodes after annealing of the junction above the recrystallization temperature of the amorphous CoFeB layers. We used X-ray reflectivity and polarized neutron reflectivity to study [Co_ 60 Fe_ 60 B_ 20 /MgO]_ x14 multilayers with the MgO layers prepared by different methods and annealed at different temperatures in order to compare the interface quality and the structural changes induced upon annealing.

Keywords

EN

Year

Volume

112

Issue

6

Pages

1249-1257

Physical description

Dates

published
2007-12
received
2007-07-04

Contributors

author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • Experimentalphysik/FestkÖrperphysik, Ruhr-Universität Bochum, Universitätsstrasse 150, 44780 Bochum, Germany
author
  • INESC-Microsystems and Nanotechnologies, Rua Alves Redol 9, 1000- 029 Lisboa, Portugal
author
  • INESC-Microsystems and Nanotechnologies, Rua Alves Redol 9, 1000- 029 Lisboa, Portugal

References

  • 1. J.S. Moodera, L.R. Kinder, T.M. Wong, R. Meservey, Phys. Rev. Lett., 74, 3273 (1995)
  • 2. T. Miyazaki, N. Tezuka, J. Magn. Magn. Mater., 139, L231 (1995)
  • 3. G. Reiss, J. Schmalhorst, A. Thomas, A. HŰtten, S. Yuasa, in: Magnetic Heterostructures, Advances and Perspectives in Spinstructures and Spintransport , Eds. H. Zabel, S.D. Bader, in series: Springer Tracts in Modern Physics , Vol. 227, p. 282
  • 4. D.X. Wang, C. Nordman, J.M. Daughton, Z.H. Qian, J. Fink, IEEE Trans. Magn., 40, 2269 (2004)
  • 5. A.T.G Pym, A. Lamperti, B.K. Tanner, T. Dimopoulos, M. RŰhrig, J. Wecker, Appl. Phys. Lett., 88, 162505 (2006)
  • 6. A. KaŰfler, Y. Luo, K. Samwer, G. Gieres, M. Vieth, J. Wecker, J. Appl. Phys., 91, 1701 (2002)
  • 7. D.D. Djayaprawira, K. Tsunekawa, M. Nagai, H. Maehara, S. Yamagata, N. Watanabe, S. Yuasa, Y. Suzuki, K. Ando, Appl. Phys. Lett., 86, 092502 (2005)
  • 8. S.S.P. Parkin, C. Kaiser, A. Panchula, P.M. Rice, B. Hughes, M. Samant, Łinebreak S.-H. Yang, Nat. Mater., 862, 04 (20
  • 9. F.F. Li, R. Sharif, L.X. Jiang, X.Q. Zhang, X.F. Han, Y. Wang, Z. Zhang, J. Appl. Phys.) 98, 113710, 05 (20
  • 10). Z.G. Zhang, P.P. Freitas, A.R. Ramos, N.P. Barradas, J.C. Soares, J. Appl. Phys., 91, 8786 (2002)
  • 11. C. Krywka, M. Paulus, C. Sternemann, M. Volmer, A. Remhof, G. Nowak, A. Nefedov, B. PÖter, M. Spiegel, M. Tolan, J. Synchr. Rad., 13, 8 (2006)
  • 12. H. Zabel, Physica B, 198, 156 (1994)
  • 13. R.P. Felcher, R.O. Hilleke, R.K. Crawford, J. Haumann, R. Kleb, G. Ostrowski, Rev. Sci. Instrum., 58, 609 (1987)
  • 14. C.F. Majkrzak, Physica B, 619, 156 (1989)
  • 15. A. Schreyer, R. Siebrecht, U. Englisch, U. Pietsch, H. Zabel, Physica B, 248, 349 (1998)
  • 16. M. Wolff, K. Zhernenkov, H. Zabel, Thin Solid Films, 515, 5712 (2007)
  • 17. A.J.G. Leenaers, D.K.G. de Boer, X-Ray Spect., 26, 115 (1997)

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv112n610kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.