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Number of results

Journal

Metrology and Measurement Systems

2021 | 28 | 4 |

Article title

Investigation of noise in surface topography measurement using structured illumination microscopy

Authors

Zhen Li , Sophie Gröger , Zhen Li , Sophie Gröger

Content

Full texts:
oai-journals-pan-pl-121804/full-text/art11_final.pdf
oai-journals-pan-pl-121804/full-text/art11_final.pdf
oai-journals-pan-pl-121804/full-text/art11_final.pdf

Title variants

PL
Investigation of noise in surface topography measurement using structured illumination microscopy

Languages of publication

EN

Abstracts

Keywords

EN
PL

Publisher

Polska Akademia Nauk

Journal

Metrology and Measurement Systems

Year

2021

Volume

28

Issue

4

Physical description

Contributors

author
Zhen Li
author
Sophie Gröger
author
Zhen Li
author
Sophie Gröger

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.oai-journals-pan-pl-121804
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