A Novel Approach of Analog Fault Classification Using a Support Vector Machines Classifier - Metrology and Measurement Systems - Issue 4 (2010) - PSJD - Yadda

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Journal

Metrology and Measurement Systems

2010 | 4 |

Article title

A Novel Approach of Analog Fault Classification Using a Support Vector Machines Classifier

Authors

Jiang Cui , Youren Wang

Content

Full texts:

oai-journals-pan-pl-107073/full-text/Journal10178-VolumeXVII%20Issue4_05%20paper.pdf

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Title variants

Languages of publication

PL

Abstracts

Keywords

PL

analog circuits fault classification Support Vector Machines Classifier Neural Networks wavelet packet decomposition Nauki Techniczne

Publisher

Polska Akademia Nauk

Journal

Metrology and Measurement Systems

Year

2010

Issue

4

Physical description

Contributors

author

Jiang Cui

author

Youren Wang

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.oai-journals-pan-pl-107073

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