Scanning Force Microscopy Studies of Implanted Silicon Crystals

• Authors: J. Lekki , M. Lekka , H. Romano , B. Cleff , Z. Stachura
• Languages of publication: EN

Abstracts

EN

Scanning force microscope has been applied to investigate wear tracks produced during friction coefficient measurements of hard steel ball against ⟨111⟩ silicon crystals implanted with Ar ions. Such treatment causes the stable and significant decrease in friction, despite the total removal of implanted species from the wear track during friction. Scanning force microscope measurements of wear tracks topography supported the former hypothesis assuming the formation of post-implantation dense microcracks structure and subsequent propagation of this structure into the bulk. Such process assures small size of wear particles and a low friction coefficient value. Additionally the microfriction force measurement method was applied to determine the friction coefficient of Si_{3}N_{4} cantilever and a wear track in Si crystal.

Keywords

EN

62.20.-x

Discipline

• 62.20.-x: Mechanical properties of solids

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1996
• Volume: 89
• Issue: 3
• Pages: 315-322

Dates

published

1996-03

Contributors

author

J. Lekki

• Institute of Nuclear Physics, Radzikowskiego 152, 31-342 Kraków, Poland

author

M. Lekka

• Institute of Nuclear Physics, Radzikowskiego 152, 31-342 Kraków, Poland

author

H. Romano

• Ecole Centrale Paris, Grande Voie des Vignes, 92295 Chatenay-Malabry Cedex, France

author

B. Cleff

• Institute of Nuclear Physics, Wilhelm-Klemm-Str. 9, 48-149 Münster, Germany

author

Z. Stachura

• Institute of Nuclear Physics, Radzikowskiego 152, 31-342 Kraków, Poland

Identifiers

DOI

10.12693/APhysPolA.89.315