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Number of results
1995 | 88 | 4 | 795-798

Article title

Lattice Parameter Relaxation during MBE of ZnTe/Cd_{1-x}Zn_{x}Te/Cd_{0.5}Zn_{0.5}Te Buffer Layers by RHLED and HRTEM

Content

Title variants

Languages of publication

EN

Abstracts

EN
The dynamics of the lattice relaxation processes were investigated us­ing a reflection of a high energy electron diffraction analysis system dur­ing growth by molecular beam epitaxy of ZnTe/Cd_{1-x}Ζn_{x}Te/Cd_{0.5}Mn_{0.5}Te buffers on GaAs substrates. The variation of the lattice parameter recorded by the high energy electron diffraction during the growth was later confirmed by an analysis of high resolution transmission electron microscopy images. We report also on an observation of oscillations of the lattice parameter during the deposition of several first layers of ZnTe on CdTe.

Keywords

EN

Year

Volume

88

Issue

4

Pages

795-798

Physical description

Dates

published
1995-10

Contributors

author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Laboratoire de Physique du Solide, CNRS-ESPCI, Rue Vauquelin,7523l Paris, France
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Laboratoire de Physique du Solide, CNRS-ESPCI, Rue Vauquelin,7523l Paris, France
author
  • Laboratoire de Physique du Solide, CNRS-ESPCI, Rue Vauquelin,7523l Paris, France

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv88z444kz
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