Positron Annihilation Study of Structural Relaxation and Crystallization in Metallic Glasses Fe_{78-x}Co_{x}Si_{9}B_{13}

• Authors: J. Filipecki
• Languages of publication: EN

Abstracts

EN

Results of measurements of positron lifetimes and X-ray diffraction in the annealed metallic glasses Fe_{78-x}Co_{x}Si_{9}B_{13} (x = 0, 20, 40, 60, 78) before and after the process of crystallization are presented. From the results it follows that the annealing process below the crystallization temperature causes changes in concentrations of positron-trapping areas and can be consistently described as the result of two contributions: topological and chemical short range ordering. The process of crystallization causes precipitation of α-Fe and β-Co crystalline phases and also formation of microvoids in the investigated samples.

Keywords

EN

61.43.Dq

Discipline

• 61.43.Dq: Amorphous semiconductors, metals, and alloys

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1993
• Volume: 83
• Issue: 3
• Pages: 303-306

Dates

published

1993-03

Contributors

author

J. Filipecki

• Institute of Physics, Pedagogical University, Armii Krajowej 13/15, 42-201 Częstochowa, Poland

Identifiers

DOI

10.12693/APhysPolA.83.303