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1991 | 79 | 2-3 | 167-170

Article title

New Electrical characterization of the Metal-Semiconductor Interface in GaAs Schottky Junctions

Authors

Content

Title variants

Languages of publication

EN

Abstracts

EN
The new possibilities of the electrical characterization of the metal-semiconductor interface in Schottky junctions are briefly outlined and demonstrated by using an example of experimental results taken from the literature. The interface parameters obtained for GaAs Schottky junctions with different metallizations are summarized.

Keywords

EN

Year

Volume

79

Issue

2-3

Pages

167-170

Physical description

Dates

published
1991-02
received
1990-08-08

Contributors

  • Research Institute for Technical Physics, Hungarian Academy of Sciences, Budapest, P.O.Box 76, H-1325, Hungary

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv79z202kz
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