Orientation Mapping and In Situ Annealing Applied for Characterization of Changes in Aluminium Alloys after Deformation

• Authors: M. Bieda
• Languages of publication: EN

Abstracts

EN

The paper presents application of combined in situ annealing and orientation mapping technique for investigation the microstructural changes in the aluminium alloy 6013 with bimodal distribution of the second phase particles during recovery and recrystallization processes. Information about grain distribution, misorientation between grains, size and shape of the grains at each stage of recrystallization process were obtained. Complexity of the experimental procedure is defined and discussed in order to avoid artificial results. Although the article described the advantages and disadvantages of those method used in transmission electron microscopy and scanning electron microscopy in the work the results from scanning electron microscopy/electron backscattering diffraction in situ heating experiments are highlighted. Obtained data are in a good agreement with previous transmission electron microscopy and calorimetry studies.

Keywords

EN

68.37.Hk; 81.40.Lm; 81.70.-q

Discipline

• 68.37.Hk: Scanning electron microscopy (SEM) (including EBIC)
• 81.70.-q: Methods of materials testing and analysis(see also 82.80.-d Chemical analysis and related physical methods of analysis)
• 81.40.Lm: Deformation, plasticity, and creep(see also 83.50.-v Deformation and flow in rheology)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2016
• Volume: 130
• Issue: 4
• Pages: 979-981

Dates

published

2016-10

Contributors

author

M. Bieda

• Institute of Metallurgy and Materials Science, Polish Academy of Sciences, Krakow, Poland

References

• [1] R. Sinclair, J. Morgiel, A.S. Kirtikar, I.-W. Wu, A. Chiang, Ultramicroscopy 51, 41 (1993), doi: 10.1016/0304-3991(93)90134-J
• [2] J.E. Bailey, Philos. Mag. 5, 833 (1960), doi: 10.1080/14786436008241221
• [3] W. Roberts, B. Lehtinen, Philos. Mag. 26, 1153 (1972), doi: 10.1080/14786437208227370
• [4] K. Sztwiertnia, F. Haessner, Mater. Sci. Forum 157-162, 1069 (1973), doi: 10.4028/www.scientific.net/MSF.157-162.1069
• [5] B. Lehtinen, W. Roberts, J. Microsc. 97, 197 (1973), doi: 10.1111/j.1365-2818.1973.tb03774.x
• [6] W.W. Mullins, Acta Metall. 6, 414 (1958), doi: 10.1016/0001-6160(58)90020-8
• [7] F.J. Humphreys, M. Ferry, Mater. Sci. Forum 5, 217 (1996), doi: 10.4028/www.scientific.net/MSF.217-222.529
• [8] P.J. Hurley, F.J. Humphreys, J. Microsc. 213, 225 (2004), doi: 10.1111/j.0022-2720.2004.01300.x
• [9] A. Lens, C. Maurice, J.H. Driver, Mater. Sci. Eng. A 403, 144 (2005), doi: 10.1016/j.msea.2005.05.010
• [10] S. Wright, M. Nowell, in: Electron Backscatter Diffraction in Materials Science, Eds. A.J. Schwartz, M. Kumar, B.L. Adams, D.P. Field, Springer, Berlin 2009, p. 329, doi: 10.1007/978-0-387-88136-2
• [11] F. Brisset, A.-L. Helbert, T. Baudin, Microsc. Microanal. 19, 969 (2013), doi: 10.1017/S1431927613000299
• [12] A. Korbel, W. Bochniak, US Patent No. 737, 959 (1998), European Patent No. 0711210 (2000)
• [13] M. Bieda, K. Sztwiertnia, A. Korneva, T. Czeppe, R. Orlicki, Solid State Phenom. 16, 13 (2010), doi: 10.4028/www.scientific.net/SSP.163.13
• [14] K. Sztwiertnia, M. Bieda, A. Korneva, Mater. Sci. Forum 753, 221 (2013), doi: 10.4028/www.scientific.net/MSF.753.221
• [15] M. Bieda, J. Kawalko, F. Brisset, K. Sztwiertnia, IOP Conf. Ser. Mater. Sci. Eng. 82, 012081 (2015), doi: 10.1088/1757-899X/82/1/012081
• [16] F.J. Humphreys, M. Hatherly, Recrystallization and Related Annealing Phenomena, Pergamon Press, Oxford 2002, doi: 10.1016/B978-0-08-041884-1.50001-5
• [17] M. Bieda, Solid State Phenom. 186, 53 (2012), doi: 10.4028/www.scientific.net/SSP.186.53

Identifiers

DOI

10.12693/APhysPolA.130.979