Hall Effect in ZnO Extrinsic Structure

• Authors: B. Dolník , J. Kurimský , K. Marton , M. Kolcun , L. Tomčo , J. Briančin , M. Fabián , M. Halama , M. Vojtko , M. Rajňák
• Languages of publication: EN

Abstracts

EN

Zinc oxide-based extrinsic composite was investigated. The sample was selected from a series of components of one production batch, prepared by standard sintering technology. The content of extrinsic elements in ZnO base was determined by SEM. Van der Pauw method with four-point electrode fixture was used for study of conducting phenomena in square-shaped sample. It is normaly preferred to assume the symmetric uniformity of the electrical properties of sample, for which sheet resistance, bulk resistivity and Hall mobility, sheet carrier density and carrier concentration can be calculated. When the uniformity of measured parameters is breached, the anisotropy in the arrangement of the internal structure may be the cause. There remains the question of whether the extrinsic ZnO material can be isotropic, regarding the electrical conductivity. Although the Hall effect has been measured, preliminary measurements indicate the presence of anisotropy in the measured samples. Before measurement the following phenomena should be taken into account: magneto-electric effect, photo-electric effect and the isothermal condition should be preserved. Paper discusses the uniformity deviations for the defined setup configurations for positive and negative magnetic field directions. Bulk resistivity has been calculated by numerical solution of van der Pauw equation. Large offset voltage during the measurement is discussed.

Keywords

EN

61.43.Dq; 72.20.My; 84.32.Ff; 84.37.+q; 81.05.Xj; 72.80.Ng

Discipline

• 84.37.+q: Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)
• 81.05.Xj: Metamaterials for chiral, bianisotropic and other complex media(see also 42.70.-a Optical materials; see also 78.67.Pt, Multilayers; superlattices; photonic structures; metamaterials)
• 84.32.Ff: Conductors, resistors (including thermistors, varistors, and photoresistors)
• 72.20.My: Galvanomagnetic and other magnetotransport effects
• 72.80.Ng: Disordered solids
• 61.43.Dq: Amorphous semiconductors, metals, and alloys

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 126
• Issue: 1
• Pages: 76-77

Dates

published

2014-07

Contributors

author

B. Dolník

• Department of Electrical Power Engineering, TU of Košice, Mäsiarska 74, 041 20 Košice, Slovakia

author

J. Kurimský

• Department of Electrical Power Engineering, TU of Košice, Mäsiarska 74, 041 20 Košice, Slovakia

author

K. Marton

• Department of Electrical Power Engineering, TU of Košice, Mäsiarska 74, 041 20 Košice, Slovakia

author

M. Kolcun

• Department of Electrical Power Engineering, TU of Košice, Mäsiarska 74, 041 20 Košice, Slovakia

author

L. Tomčo

• Department of Aerodynamics and Simulations, TU of Košice, Rampová 7, 041 21 Košice, Slovakia

author

J. Briančin

• Institute of Geotechnic, SAS, Watsonova 45, 043 53 Košice, Slovakia

author

M. Fabián

• Institute of Geotechnic, SAS, Watsonova 45, 043 53 Košice, Slovakia

author

M. Halama

• Department of Material Science, TU of Košice, Park Komenského 11, 040 01 Košice, Slovakia

author

M. Vojtko

• Department of Material Science, TU of Košice, Park Komenského 11, 040 01 Košice, Slovakia

author

M. Rajňák

• Institute of Experimental Physics SAS, Watsonova 47, 040 01 Košice, Slovakia

References

• [1] R. Hong, T. Pan, J. Qian, H. Li, Chem. Eng. J. 119, 71 (2006), doi: 10.1016/j.cej.2006.03.003
• [2] J.H. Jun, H. Seong, K. Cho, B.-M. Moon, S. Kim, Ceramics International 35, 2797 (2009), doi: 10.1016/j.ceramint.2009.03.032
• [3] M. Matsuoka, Jpn. J. Appl. Phys. 10, 736 (1971), doi: 10.1143/JJAP.10.736
• [4] H.J. Yearian, Phys. Rev. 48, 631 (1935), doi: 10.1103/PhysRev.48.631
• [5] Z.Ch. Feng, Handbook of Zinc Oxide and Related Materials CRC Press, London, UK 2012
• [6] L.J. van der Pauw, Philips Tech. Rew. 20, 220 (2004)

Identifiers

DOI

10.12693/APhysPolA.126.76