EN
We have studied temperature dependencies of the switching field in as-cast and nanocrystalline glass-coated Fe_{40}Ni_{38}Mo_{4}B_{18} microwires. The switching field shows complex temperature dependence in the as-cast state reflecting the complex stress distribution induced during annealing. The temperature dependence of the switching field depends strongly on the stage of nanocrystallization being negative for low temperatures of annealing and positive for annealing at 700 K.