Conduction Mechanism of 4-Aminoantipyrine as a New Organic Semiconductor

• Authors: I. Yahia
• Languages of publication: EN

Abstracts

EN

X-ray diffraction pattern of 4-aminoantipyrine was studied and it is a single phase with a polycrystalline structure. 4-aminoantipyrine has hexagonal structure with space group P6/mcc. The electrical properties of 4-aminoantipyrine were studied in the temperature range (303-373 K) below the melting point of the studied compound and in the frequency range (100 Hz-100 kHz). The obtained results of dc conductivity showed a positive temperature coefficient at the lower temperatures and a negative temperature coefficient at the higher temperatures. The ac conductivity obeys the power law. Ac conductivity can be reasonably interpreted in terms of overlapping-large polaron tunneling model and the correlated barrier hopping model. 4-aminoantipyrine is a good candidate for electronic device due to its electrical conductivity and capacitance.

Keywords

EN

78.40.Me; 78.40.Fy; 72.10.Fk; 77.84.Bw

Discipline

• 77.84.Bw: Elements, oxides, nitrides, borides, carbides, chalcogenides, etc.
• 72.10.Fk: Scattering by point defects, dislocations, surfaces, and other imperfections (including Kondo effect)
• 78.40.Me: Organic compounds and polymers
• 78.40.Fy: Semiconductors

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 125
• Issue: 5
• Pages: 1167-1171

Dates

published

2014-05

received

2012-09-15

(unknown)

2013-01-18

Contributors

author

I. Yahia

• Department of Physics, Faculty of Science, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia
• Center of Excellence for Advanced Materials Research, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia

References

• [1] F. Yakuphanoglu, Physica B 393, 139 (2007), doi: 10.1016/j.physb.2006.12.075
• [2] T.A. Skotheim, R.L. Elsenbaumer, J.R. Reynolds, Handbook of Conducting Polymers, Marcel Dekker, New York 1998
• [3] M.C. Petty, M.R. Bryce, D. Bloor, An Introduction to Molecular Electronics, Edward Arnold, London 1995
• [4] L. Leontie, M. Roman, I. Caplanus, G.I. Rusu, Prog. Org. Coat. 44, 287 (2002), doi: 10.1016/S0300-9440(02)00061-9
• [5] G. Liang, T. Cui, K. Varahramyan, Microelectron. Eng. 65, 279 (2003), doi: 10.1016/S0167-9317(02)00901-2
• [6] F. Yakuphanoglu, I. Erol, Physica B 352, 378 (2004), doi: 10.1016/j.physb.2004.08.018
• [7] C.J.F. Boltcher, P. Bordewijk, Theory of Electric Polarization, Vols. I and II, 2nd ed., Elsevier, New York 1978
• [8] N.G. McCrum, B.E. Readond, G. Williams, An Elastic and Dielectric Effects in Polymeric Solids, Wiley, New York 1967
• [9] Komilla Suri, S. Annapoorni, R.P. Tandon, J. Non-Crystalline Solids 332, 279 (2003), doi: 10.1016/S0022-3093(03)00329-6
• [10] http://www.chemyq.com/En/xz/xz1/4750nlimc.htm
• [11] Sh.A. Mansour, I.S. Yahia, F. Yakuphanoglu, Dyes Pigments 87, 144 (2010), doi: 10.1016/j.dyepig.2010.03.011
• [12] Sh.A. Mansour, I.S. Yahia, G.B. Sakr, Solid State Commun. 150, 1386 (2010), doi: 10.1016/j.ssc.2010.04.029
• [13] A.A.M. Farag, I.S. Yahia, Synth. Metals 161, 32 (2011), doi: 10.1016/j.synthmet.2010.10.030
• [14] I.S. Yahia, M.S. Abd El-Sadek, F. Yakuphanoglu, Dyes Pigments 93, 1434 (2012), doi: 10.1016/j.dyepig.2011.10.002
• [15] F. Yakuphanoglu, Ph.D Thesis, Firat University, Elazig, Turkey 2002
• [16] U. Schatzschneider, T. Weyhermüller, E. Rentschler, Eur. J. Inorg. Chem., 2569 (2001), doi: 10.1002/1099-0682(200109)2001:10<2569::AID-EJIC2569>3.0.CO;2-3
• [17] F. Yakuphanoglu, Y. Aydogdu, U. Schatzschneider, E. Rentschler, Solid State Commun. 128, 63 (2003), doi: 10.1016/S0038-1098(03)00651-3
• [18] M.S. Masoud, S.A. El-Enein, E. El-Shereafy, J. Therm. Anal. 37, 365 (1991), doi: 10.1007/BF02055938
• [19] Y. Aydogdu, F. Yakuphanoglu, A. Aydogdu, E. Tas, A. Cukurovali, Solid State Sci. 4, 879 (2002), doi: 10.1016/S1293-2558(02)01298-0
• [20] A. Ghosh, Phys. Rev. B 41, 1480 (1990)
• [21] A. Ghosh, Phys. Rev. B 42, 5665 (1990)
• [22] M. Pollak, G.E. Pike, Phys. Rev. Lett. 28, 1494 (1972)
• [23] M. Pollak, T.H. Geballe, Phys. Rev. 122, 1742 (1961)
• [24] A.R. Long, Adv. Phys. 31, 553 (1982)
• [25] A.R. Long, N. Balkan, W.R. Hogg, R.P. Ferrier, Philos. Mag. B 45, 497 (1982)
• [26] A. Ghosh, Phys. Rev. B 41, 1479 (1990), doi: 10.1103/PhysRevB.41.1479
• [27] G.E. Pike, Phys. Rev. B 6, 1572 (1972)
• [28] S.R. Elliott, Philos. Mag. B 37, 135 (1978)
• [29] S.R. Elliott, Philos. Mag. B 36, 129 (1978)
• [30] B.K. Chaudhuri, K. Chaudhuri, K.K. Som, J. Phys. Chem. Solids 50, 1147 (1989), doi: 10.1016/0022-3697(89)90023-1
• [31] A. Goswami, A.P. Goswami, Thin Solid Films 16, 175 (1973), doi: 10.1016/0040-6090(73)90166-1
• [32] M.A.M. Seyam, Appl. Surf. Sci. 181, 128 (2001), doi: 10.1016/S0169-4332(01)00378-6
• [33] P.W. Zukowski, S.B. Kantorow, D. Maczka, V.F. Stelmakh, Phys. Status Solidi A 112, 695 (1989), doi: 10.1002/pssa.2211120225
• [34] A. Vasudevan, S. Carin, M.R. Melloch, E.S. Harmon, Appl. Phys. Lett. 73, 671 (1998), doi: 10.1063/1.121943
• [35] A.M.A. El-Barry, H.E. Atyia, Physica B 368, 1 (2005), doi: 10.1016/j.physb.2005.06.011

Identifiers

DOI

10.12693/APhysPolA.125.1167