The Application of Scattered Light in the Metrology of Planar Waveguides

• Authors: K. Gut
• Languages of publication: EN

Abstracts

EN

The paper presents a measuring stand which permits to determine the attenuation and modal birefringence of planar waveguide structures. The light is introduced into the waveguide through a prismatic coupler. This permits to determine attenuations of the subsequent modes. Mounting the polarizer in front of the lens of the camera it becomes possible to determine on the same test stand the modal birefringence of orthogonal pair of modes of the same order.

Keywords

EN

42.25.Ja; 42.25.Lc; 42.25.Fx

Discipline

• 42.25.Fx: Diffraction and scattering
• 42.25.Ja: Polarization
• 42.25.Lc: Birefringence

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2012
• Volume: 122
• Issue: 5
• Pages: 818-820

Dates

published

2012-11

Contributors

author

K. Gut

• Department of Optoelectronics, Silesian University of Technology Akademicka 2A, 44-100 Gliwice, Poland

References

• [1] R.G. Hunsperger, Integrated Optics Theory and Technology, Springer, Berlin 2009
• [2] A. Boudrioua, J.C. Loulergue, Opt. Commun. 137, 37 (1997)
• [3] R.K. Hickernell, D.R. Larson, R.J. Phelan Jr., L.E. Larson, Appl. Opt. 27, 2636 (1988)
• [4] T. Feuchter, C. Thirstrup, IEEE Photon. Technol. Lett. 6, 1244 (1994)
• [5] T.A. Strasser, M.C. Gupta, Appl. Opt. 31, 2041 (1992)
• [6] F. Wang, F. Liu, G. Chang, Opt. Eng. 47, 024602 (2008)
• [7] K. Gut, K. Nowak, Eur. Phys. J.-Spec. Top. 154, 89 (2008)
• [8] P. Struk, T. Pustelny, K. Gut, K. Gołaszewska, E. Kaninska, M. Ekielski, I. Pasternak, E. Łusakowska, A. Piotrowska, Acta Phys. Pol. A 116, 414 (2009)
• [9] K. Gut, D. Nabaglo, Acta Phys. Pol. A 116, 307 (2009)
• [10] K. Gut, A. Zakrzewski, T. Pustelny, Acta Phys. Pol. A 118, 1140 (2010)
• [11] K. Barczak, T. Pustelny, Z. Zycki, T. Blazejczak, Acta Phys. Pol. A 116, 250 (2009)
• [12] K. Gut, J. Phys. IV JP (France) 129, 109 (2005)
• [13] M. Szczurowski, W. Urbanczyk, M. Napiorkowski, P. Hlubina, U. Hollenbach, H. Sieber, J. Mohr, Appl. Opt. 50, 2594 (2011)
• [14] T. Pustelny, J. Ignac-Nowicka, B. Jarząbek, A. Burian, Opt. Appl. 34, 551 (2004)
• [15] K. Barczak, T. Pustelny, D. Dorosz, J. Dorosz, Europ. Phys. J. Spec. Top. 154, 11 (2008)
• [16] K. Gut, Acta Phys. Pol. A 114, A121 (2008)
• [17] A. Opilski, R. Rogoziński, K. Gut, M. Błahut, Z. Opilski, Opto-Electron. Rev. 8, 117 (2000)
• [18] K. Gut, S. Drewniak, Acta Phys. Pol. A 118, 1134 (2010)
• [19] K. Gut, T. Pustelny, D. Nabaglo, Acta Phys. Pol. A 118, 1136 (2010)
• [20] K. Gut, P. Karasinski, W.T. Wójcik, R. Rogozinski, Z. Opilski, A. Opilski, Opt. Appl. 29, 101 (1999)
• [21] K. Gut, S. Drewniak, Acta Phys. Pol. A 120, 630 (2011)
• [22] C. Tyszkiewicz, T. Pustelny, Opt. Appl. 34, 507 (2004)
• [23] K. Gut, Bull. Pol. Acad. Sci.: TS 59, 395 (2011)
• [24] T. Pustelny, I. Zielonka, C. Tyszkiewicz, P. Karasinski, B. Pustelny, Opto-Electron. Rev. 14, 161 (2006)
• [25] T. Pustelny, K. Barczak, K. Gut, J. Wojcik, Opt. Appl. 34, 531 (2004)
• [26] T. Pustelny, M. Grabka, Acta Phys. Pol. A 116, 385 (2009)
• [27] S.Y. Cheng, K.S. Chiang, IEEE Photon. Technol. Lett. 15, 700 (2003)
• [28] W.W. Hu, K. Inagaki, Y. Mizuguchi, Opt. Lett. 26, 193 (2001)

Identifiers

DOI

10.12693/APhysPolA.122.818