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Number of results
2012 | 121 | 1 | 33-35

Article title

Deposition and Characterization of CdS, CuS and ZnS Thin Films Deposited by SILAR Method

Content

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Languages of publication

EN

Abstracts

EN
Cadmium sulfide, copper sulfide and zinc sulfide films were grown on Si(111) substrate by successive ionic layer adsorption and reaction method at room temperature. The crystalline structure and morphology of obtained films were characterized by X-ray diffraction, scanning electronic microscope and energy dispersive X-ray analysis methods. The films were polycrystalline and showed preferred orientation. The surface morphology of these films looked relatively smooth and homogeneous in the scanning electron microscope image. The energy dispersive X-ray analysis spectra showed that the expected elements exist in the thin films.

Keywords

EN

Contributors

author
  • Department of Physics, Faculty of Sciences, University of Atatürk, Erzurum, Turkey
author
  • Department of Physics, Faculty of Sciences, University of Atatürk, Erzurum, Turkey
author
  • Department of Material Eng., Faculty of Eng. and Nature Sciences, University of Yıldırım Beyazıt, Ankara, Turkey

References

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Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv121n109kz
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