Cathodoluminescence Measurements at Liquid Helium Temperature of Poly- and Monocrystalline ZnO Films

• Authors: B. Witkowski , Ł. Wachnicki , R. Jakieła , E. Guziewicz , M. Godlewski
• Languages of publication: EN

Abstracts

EN

Scanning electron microscopy, cathodoluminescence and secondary ion mass spectroscopy investigations are used to study an inter-link between structural quality, elements distribution and light emission properties of ZnO poly- and monocrystalline films grown by the atomic layer deposition. Cathodoluminescence and scanning electron microscopy investigations were performed at liquid helium temperature for four different types of ZnO films deposited on different substrates.

Keywords

EN

78.60.Hk; 77.55.hf; 68.37.Hk; 61.72.Ff

Discipline

• 68.37.Hk: Scanning electron microscopy (SEM) (including EBIC)
• 61.72.Ff: Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)
• 77.55.hf: ZnO
• 78.60.Hk: Cathodoluminescence, ionoluminescence

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 120
• Issue: 6A
• Pages: A-28-A-30

Dates

published

2011-12

Contributors

author

B. Witkowski

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

Ł. Wachnicki

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

R. Jakieła

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

E. Guziewicz

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

M. Godlewski

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
• Dept. of Mathematics and Natural Sciences College of Science, Cardinal S. Wyszyński University, Dewajtis 5, 01-815 Warsaw, Poland

References

• [1] C. Klingshirn, Phys. Status Solidi B 244, 3027 (2007)
• [2] M. Godlewski, E. Guziewicz, G. Łuka, T. Krajewski, M. Łukasiewicz, Ł. Wachnicki, A. Wachnicka, K. Kopalko, A. Sarem, B. Dalati, Thin Solid Films 518, 1145 (2009)
• [3] S. Gieraltowska, L. Wachnicki, B.S. Witkowski, M. Godlewski, E. Guziewicz, Thin Solid Films, to be published
• [4] N. Huby, G. Tallarid, M. Kutrzeba, S. Ferrari, E. Guziewicz, Ł. Wachnicki, M. Godlewski, Microelectron. Eng. 85, 2442 (2008)
• [5] Ł. Wachnicki, T. Krajewski, G. Łuka, B. Witkowski, B. Kowalski, K. Kopalko, J.Z. Domagala, M. Guziewicz, M. Godlewski, E. Guziewicz, Thin Solid Films 518, 4556 (2010)
• [6] H.P. He, H.P. Tang, Z.Z. Ye, L.P. Zhu, B.H. Zhao, L. Wang, X.H. Li, Appl. Phys. Lett. 90, 023104 (2007)

Identifiers

DOI

10.12693/APhysPolA.120.A-28