Room-Temperature Ferromagnetism in Zn-Mn-O, X-Ray Photoemission Surface Study

• Authors: D. Milivojević , B. Babić-Stojić , J. Blanuša , J. Kovač
• Languages of publication: EN

Abstracts

EN

Room temperature ferromagnetic properties of Zn-Mn-O show evident dependence on manganese concentration and preparation conditions. We systematically studied series of samples with manganese concentration ranging from 0 to 10 at.%, prepared in air at thermal treatment temperatures ranging from 400 to 900°C. The samples were investigated by X-ray diffraction, TEM, magnetization measurements and XPS spectroscopy. XPS analyses of surface composition, chemical bonding and XPS depth profiling were successfully employed on powder revealing the chemical composition at the surface of the grains and underneath. The study emphasizes important role of the grain surface in observed room temperature ferromagnetism. It seems that the ferromagnetic phase is correlated with oxygen build up at the surface.

Keywords

EN

75.50.Pp; 81.40.Rs; 81.70.Jb; 82.80.Pv

Discipline

• 81.70.Jb: Chemical composition analysis, chemical depth and dopant profiling
• 81.40.Rs: Electrical and magnetic properties related to treatment conditions
• 82.80.Pv: Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
• 75.50.Pp: Magnetic semiconductors

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 120
• Issue: 2
• Pages: 311-315

Dates

published

2011-08

Contributors

author

D. Milivojević

• Vinča Institute of Nuclear Sciences, University of Belgrade, P.O.Box 522, Belgrade, Serbia

author

B. Babić-Stojić

• Vinča Institute of Nuclear Sciences, University of Belgrade, P.O.Box 522, Belgrade, Serbia

author

J. Blanuša

• Vinča Institute of Nuclear Sciences, University of Belgrade, P.O.Box 522, Belgrade, Serbia

author

J. Kovač

• Jožef Stefan Institute, Department for Materials Synthesis, Jamova 39, 1000 Ljubljana, Slovenia

References

• 1. T. Dietl, H. Ohno, F. Matsukura, J. Cibert, D. Ferrand, Science 287, 1019 (2000)
• 2. U. Ozgur, Ya.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, H. Morkoc, J. Appl. Phys. 98, 041301 (2005)
• 3. P. Sharma, A. Gupta, K.V. Rao, F.J. Owens, R. Sharma, R. Ahuja, J.M. Osorio Guillen, B. Johansson, G.A. Gehring, Nat. Mater. 2, 673 (2003)
• 4. B. Babić-Stojić, D. Milivojević, J. Blanuša, V. Spasojević, N. Bibić, B. Simonović, D. Aranđelović, J. Phys.: Condens. Matter 20, 235217 (2008)
• 5. J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, Handbook of X-Ray Photoelectron Spectroscopy (Physical Electronics Inc., Eden Prairie, Minnesota, USA, 1995)
• 6. O.D. Jayakumar, C. Sudakar, A. Vinu, A. Asthana, A.K. Tyagi, J. Phys. Chem. C113, 4814 (2009)
• 7. X.Q. Wei, B.Y. Man, M. Liu, C.S. Xue, H.Z. Zhuang, C. Yang, Physica B 388, 145 (2007)
• 8. L. Li, L. Fang, X.J. Zhou, Z.Y. Liu, L. Zhao, S. Jiang, J. Electron. Spectrosc. Relat. Phenom. 173, 7 (2009)
• 9. D. Rubi, J. Fontcuberta, A. Calleja, Ll. Aragones, X.G. Capdevila, M. Segarra, Phys. Rev. B75, 155322 (2007)
• 10. C. Zhou, J. Kang, J. Mater. Sci.: Mater. Electron 19, S229 (2008)
• 11. B.B. Straumal, A.A. Mazilkin, S.G. Protasova, A.A. Myatiev, P.B. Straumal, G. Schutz, P.A. van Aken, E. Goering, B. Baretzky, Phys. Rev. B79, 205206 (2009)
• 12. K. Sato, H. Katayama-Yoshida, Semicond. Sci. Technol. 17, 367 (2002)
• 13. J. Goniakowski, F. Finocchi, C. Noguera, Rep. Prog. Phys. 71, 016501 (2008)

Identifiers

DOI

10.12693/APhysPolA.120.311