Secondary Radiation Field Effects for the CEM Spectra

• Authors: K. Ruebenbauer , A. Błachowski , J. Żukrowski
• Languages of publication: EN

Abstracts

EN

The secondary resonant radiation field and resonant absorption thickness effects on the Conversion Electron Mössbauer Spectroscopy spectra are analyzed for highly enriched resonant targets. It is shown that secondary field effect is important for the thick α-Fe foil enriched in the resonant isotope. Even for the polycrystalline sample traces of the coherent resonant field have been detected as the distortion of lines. Secondary field is discussed in detail. Suitable approximations to treat spectra originating from targets with significant resonant thickness developing secondary field composed of the incoherent and coherent parts are introduced. Finally, the formalism is applied to the high quality spectrum recorded for the enriched iron foil and correlation between contribution due to the secondary field and experimental line shape is investigated.

Keywords

EN

76.80.+y; 82.80.Ej; 23.20.Nx; 42.40.Kw

Discipline

• 82.80.Ej: X-ray, Mössbauer, and other γ-ray spectroscopic analysis methods
• 76.80.+y: Mössbauer effect; other γ-ray spectroscopy(see also 33.45.+x Mössbauer spectra—in atomic and molecular physics; for biophysical applications, see 87.64.kx; for chemical analysis applications, see 82.80.Ej)
• 42.40.Kw: Holographic interferometry; other holographic techniques(for interferometers, see 07.60.Ly in instruments)
• 23.20.Nx: Internal conversion and extranuclear effects (including Auger electrons and internal bremsstrahlung)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 117
• Issue: 6
• Pages: 953-961

Dates

published

2010-06

received

2009-07-23

(unknown)

2010-03-09

Contributors

author

K. Ruebenbauer

• Mössbauer Spectroscopy Division, Institute of Physics, Pedagogical University, Podchorążych 2, PL-30-084 Kraków, Poland

author

A. Błachowski

• Mössbauer Spectroscopy Division, Institute of Physics, Pedagogical University, Podchorążych 2, PL-30-084 Kraków, Poland

author

J. Żukrowski

• Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 21, PL-30-059 Kraków, Poland

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Identifiers

DOI

10.12693/APhysPolA.117.953