Characterization of Transparent and Nanocrystalline TiO_{2}:Nd Thin Films Prepared by Magnetron Sputtering

• Authors: J. Domaradzki , D. Wojcieszak , E. Prociow , D. Kaczmarek
• Languages of publication: EN

Abstracts

EN

In this work structural and optical properties of TiO_{2} thin films doped with different amount of Nd have been outlined. The result have shown that by quantity of Nd amount in the film dense nanocrystalline or amorphous thin films were obtained.

Keywords

EN

61.82.Rx; 68.55.-a; 68.60.-p; 68.60.Dv; 78.20.-e

Discipline

• 61.82.Rx: Nanocrystalline materials
• 68.60.Dv: Thermal stability; thermal effects
• 68.60.-p: Physical properties of thin films, nonelectronic
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)
• 68.55.-a: Thin film structure and morphology(for methods of thin film deposition, film growth and epitaxy, see 81.15.-z)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2009
• Volume: 116
• Issue: S
• Pages: S-75-S-77

Dates

published

2009-12

Contributors

author

J. Domaradzki

• Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wrocław, Poland

author

D. Wojcieszak

• Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wrocław, Poland

author

E. Prociow

• Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wrocław, Poland

author

D. Kaczmarek

• Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wrocław, Poland

References

• 1. K. Okimura, Surf. Coat. Technol. 135, 286 (2001)
• 2. G. Korotcenkov, Mater. Sci. Eng. B 139, 1 (2007)
• 3. A.I. Martınez, D.R. Acosta, G. Cedillo, Thin Solid Films 490, 118 (2005)
• 4. L. Sirghi, T. Aoki, Y. Hatanaka, Thin Solid Films 422, 55 (2002)
• 5. L. Zheng, M. Xu, T. Xu, Sensors Actuators B 66, 28 (2000)
• 6. Z. Niu, X. Jia, W. Zhang, W. Chen, K.Y. Qian, Appl. Surf. Sci. 252, 2259 (2006)
• 7. R. Weingartner, O. Erlenbach, A. Winnacker, A. Welte, I. Brauer, H. Mendel, H.P. Strunk, C.T.M. Ribeiro, A.R. Zanatta, Opt. Mater. 28, 790 (2006)
• 8. Powder Diffraction File, Joint Committee on Powder Diffraction Standards ASTM Philadelphia PA, 1967, Card 21-1272
• 9. Powder Diffraction File, Joint Committee on Powder Diffraction Standards ASTM Philadelphia PA, 1967, Card 21-1276
• 10. D. Kaczmarek, J. Domaradzki, D. Wojcieszak, R. Wasilewski, A. Borkowska, E.L. Prociów, A. Ciszewski, Appl. Surf. Sci. 254, 4303 (2008)

Identifiers

DOI

10.12693/APhysPolA.116.S-75