Structural Relaxation of Ni-Si-B Amorphous Ribbon

• Authors: A. Juríková , K. Csach , J. Miškuf , V. Ocelík
• Languages of publication: EN

Abstracts

EN

The structural relaxation of the Ni-Si-B amorphous ribbon was studied by means of differential scanning calorimetry and thermomechanical analysis. It was shown that considerable length changes associated with reversible structural relaxation were revealed after a previous creep applied at higher temperatures.

Keywords

EN

61.43.Dq; 62.20.Hg

Discipline

• 62.20.Hg: Creep
• 61.43.Dq: Amorphous semiconductors, metals, and alloys

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2008
• Volume: 113
• Issue: 1
• Pages: 99-102

Dates

published

2008-01

received

2007-07-09

Contributors

author

A. Juríková

• Institute of Experimental Physics, Slovak Academy of Sciences, Watsonova 47, 040 01 Košice, Slovakia

author

K. Csach

• Institute of Experimental Physics, Slovak Academy of Sciences, Watsonova 47, 040 01 Košice, Slovakia

author

J. Miškuf

• Institute of Experimental Physics, Slovak Academy of Sciences, Watsonova 47, 040 01 Košice, Slovakia

author

V. Ocelík

• Department of Applied Physics, Materials Science Centre and Netherlands, Institute of Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

References

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Identifiers

DOI

10.12693/APhysPolA.113.99