Scanning Tunnelling Spectroscopy of Periodic Nickel Nanoparticles

• Authors: M. Kamiński , B. Susła , M. Giersig , M. Kandulski
• Languages of publication: EN

Abstracts

EN

Scanning tunneling microscopy/spectroscopy as well as atomic force microscopy were applied to study the non-structural and nanoelectronic properties of periodic nickel nanoparticles deposited on n-silicon substrates. Periodic nickel (Ni) nanoparticles were prepared by using nanosphere lithography and analyzed by scanning tunneling microscopy/spectroscopy and atomic force microscopy. By the evaporation of Ni perfectly ordered nanoparticles were produced and very good correlation between latex mask was observed. Finally, tunneling spectroscopy performed with non-magnetic tip yield information about local electronic properties of nanoscale structures at surface.

Keywords

EN

68.37.Ef; 61.48.+w

Discipline

• 68.37.Ef: Scanning tunneling microscopy (including chemistry induced with STM)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2003
• Volume: 104
• Issue: 3-4
• Pages: 351-356

Dates

published

2003-09/10

received

2003-07-16

Contributors

author

M. Kamiński

• Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland

author

B. Susła

• Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland

author

M. Giersig

• Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland
• "CAESAR" Dept. Nanoparticle Technology, Ludwig-Erhard-Allee 2, 53175 Bonn, Germany

author

M. Kandulski

• Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland

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Identifiers

DOI

10.12693/APhysPolA.104.351