Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction

• Authors: J. Pełka , S. Lagomarsino
• Languages of publication: EN

Abstracts

EN

The effect of resonance, observed in X-ray waveguide layered structures in a characteristic way influences the scattering properties of the films. It is well known that in the resonant region the reflectivity shows a series of minima, usually very deep and extremely narrow. The positions and depths of the minima depend only on X-ray waveguide structural properties, on the X-ray wavelength and on the incident beam divergence. In the present work we propose and discuss the application of the X-ray waveguide and quasi X-ray waveguide film structures as tools to experimental evaluation of some quantities related to X-ray reflectometric or diffractometric measurements, like the beam divergence, wavelength, or angular distance. Examples of application of the X-ray waveguide as an excellent tool to estimate the effective beam divergence are shown. Properties of the X-ray waveguide elements as a handy wavelength or angular calibration standard are also mentioned.

Keywords

EN

68.65.-k; 61.10.Kw; 06.30.Bp

Discipline

• 06.30.Bp: Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
• 68.65.-k: Low-dimensional, mesoscopic, nanoscale and other related systems: structure and nonelectronic properties(for structure of nanoscale materials, see 61.46.-w; for magnetic properties of interfaces, see 75.70.Cn; for superconducting properties, see 74.78.-w; for optical properties, see 78.67.-n; for transport properties, see 73.63.-b; for thermal properties of nanocrystals and nanotubes, see 65.80.-g; for mechanical properties of nanoscale systems, see 62.25.-g)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2002
• Volume: 102
• Issue: 2
• Pages: 233-238

Dates

published

2002-08

received

2001-09-23

Contributors

author

J. Pełka

• Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

S. Lagomarsino

• IESS CNR, V. Cineto Romano 42, 00156 Roma, Italy

References

• 1. A. Cedola, S. Lagomarsino, S. Di Fonzo, W. Jark, C. Riekel, P. Deschamps, J. Synchrotron Radiat., 5, 17, 1998
• 2. W. Jark, S. Di Fonzo, S. Lagomarsino, A. Cedola, E. Di Fabrizio, A. Bram, C. Riekel, J. Appl. Phys., 80, 4831, 1996
• 3. S. Di Fonzo, W. Jark, S. Lagomarsino, A. Cedola, B. Muller, J.B. Pełka, Thin Solid Films, 287, 288, 1996
• 4. J. Wang, M.J. Bedzyk, T.L. Penner, M. Caffrey, Nature, 354, 377, 1991
• 5. D.K.G. De Boer, Phys. Rev. B, 44, 498, 1991
• 6. L.G. Parratt, Phys. Rev., 95, 359, 1954
• 7. J.B. Pełka, W. Paszkowicz, M. Brust, C.J. Kiely, M. Knapp, in: HASYLAB Jahresbericht 2000, Vol. I, Eds. W. Dix, T. Kracht, U. Krell, G. Materlik, J.R. Schneider, HASYLAB, Hamurg 2000, p. 461

Identifiers

DOI

10.12693/APhysPolA.102.233