Microstructure Analysis of Nanocrystalline Powders by X-ray Diffraction

• Authors: D. Louër , N. Audebrand
• Languages of publication: EN

Abstracts

EN

The use of X-ray diffraction line profile analysis for the study of nanocrystalline powders is described. The fundamentals of the theory are presented in terms of crystallite/domain size, size distribution, lattice distortion, dislocation density and stacking faults. Line profile parameters and the methods of pattern fitting introduced to overcome the diffraction-line overlap problem are described. The approaches based of the integral breadth of the measured line profiles and the Fourier method are discussed. In addition, simplified approaches are also commented. Representative examples are selected to illustrate various cases of microstructure, such as nanomaterials with strain-free spherical nanocrystallites, strain-free crystallites with anisotropic crystallite shape, anisotropic crystallites with microstrains and spherical crystallites with dislocation densities and crystallite size distributions.

Keywords

EN

61.10.Dp; 61.10.Nz; 61.46.+w; 61.72.Dd; 61.72.Lk; 61.72.Mm

Discipline

• 61.72.Lk: Linear defects: dislocations, disclinations
• 61.72.Mm: Grain and twin boundaries
• 61.72.Dd: Experimental determination of defects by diffraction and scattering

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2002
• Volume: 102
• Issue: 1
• Pages: 45-56

Dates

published

2002-07

received

2001-09-23

Contributors

author

D. Louër

• Laboratoire de Chimie du Solide et Inorganique Moléculaire (UMR CNRS 6511), Institut de Chimie, Université de Rennes, Av. du Général Leclerc, 35042 Rennes cedex, France

author

N. Audebrand

• Laboratoire de Chimie du Solide et Inorganique Moléculaire (UMR CNRS 6511), Institut de Chimie, Université de Rennes, Av. du Général Leclerc, 35042 Rennes cedex, France

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Identifiers

DOI

10.12693/APhysPolA.102.45