Lattice Parameters of Aluminium Nitride in the Range 10-291 K

• Authors: W. Paszkowicz , M. Knapp , S. Podsiadło , G. Kamler , J. Pełka
• Languages of publication: EN

Abstracts

EN

Lattice parameters for aluminium nitride were determined using X-ray powder diffraction at a synchrotron radiation source (beamline B2, Hasylab/DESY, Hamburg) in the temperature range from 10 K to 291 K. The measurements were carried out using the Debye-Scherrer geometry. The relative change of both, a and c, on rising the temperature in the studied range (10-291 K) is about 0.03%. The results are compared with earlier laboratory data and theoretical predictions.

Keywords

EN

81.05.Je; 65.40.De; 65.60.+a; 65.40.-b

Discipline

• 65.40.-b: Thermal properties of crystalline solids
• 65.40.De: Thermal expansion; thermomechanical effects
• 81.05.Je: Ceramics and refractories (including borides, carbides, hydrides, nitrides, oxides, and silicides)(for ceramics in electrochemistry, see 82.45.Yz)
• 65.60.+a: Thermal properties of amorphous solids and glasses: heat capacity, thermal expansion, etc.

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2002
• Volume: 101
• Issue: 5
• Pages: 781-785

Dates

published

2002-05

received

2001-08-31

Contributors

author

W. Paszkowicz

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

M. Knapp

• Darmstadt University of Technology, Institute of Materials Science, Petersenstr. 23, 64287 Darmstadt, Germany

author

S. Podsiadło

• Faculty of Chemistry, Warsaw University of Technology, Noakowskiego 3, 00-664 Warsaw, Poland

author

G. Kamler

• Faculty of Chemistry, Warsaw University of Technology, Noakowskiego 3, 00-664 Warsaw, Poland

author

J. Pełka

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

References

• 1. G.A. Slack, B.F. Bartram, J. Appl. Phys., 46, 89, 1975
• 2. J.H. Edgar, in: Properties of Group III Nitrides, EMIS Datareviews Series, Ed. J.H. Edgar, British Institution of Electrical Engineers Publ., INSPEC, London 1994, p. 7
• 3. S.N. Ivanov, P.A. Popov, G.V. Egorov, A.A. Sidorov, B.I. Korneev, L.M. Zhukova, B.P. Ryabov, Phys. Solid State, 39, 83, 1997 [translated from Fiz. Tverd. Tela, 39, 93, 1997]
• 4. S. Burghartz, FZKA Report No. 5616, Forschungszentrum Karlsruhe GmbH, Karlsruhe 1995
• 5. K. Wang, R.R. Reeber, Mater. Res. Soc. Symp. Proc., 482, 863, 1998
• 6. S. Podsiadło, Thermochim. Acta, 256, 367, 1995
• 7. S. Podsiadło, Thermochim. Acta, 256, 375, 1995
• 8. J. Ihringer, A. Koester, J. Appl. Crystallogr., 26, 135, 1993
• 9. R.A. Young, A. Sakthivel, T.S. Moss, C.O. Paiva-Santos, J. Appl. Crystallogr., 28, 366, 1995
• 10. PDF 46-1212, International Centre for Diffraction Data, PA 1999
• 11. W. Paszkowicz, S. Podsiadło, unpublished
• 12. G.A. Slack, J. Phys. Chem. Solids, 34, 321, 1973
• 13. W.M. Yim, R.J. Paff, J. Appl. Phys., 45, 1456, 1974
• 14. H.F. McMurdie, M.C. Morris, E.H. Evans, B. Paretzkin, J.H. de Groot, C.R. Hubbard, S.J. Carmel, Standard X-ray Diffraction Patterns, NBS Monograph 25 Sec. 12, Institute for Materials Research, National Bureau of Standards, Washington DC 1975, p. 5
• 15. M. Tanaka, S. Nakahata, K. Sogabe, H. Nakata, M. Tobioka, Jpn. J. Appl. Phys. Lett., 36, L1062, 1997
• 16. Y.C. Lan, X.L. Chen, Y.G. Cao, Y.P. Xu, L.D. Xun, T. Xu, J.K. Liang, J. Cryst. Growth, 207, 247, 1999
• 17. H. Iwanaga, A. Kunishige, S. Takeuchi, J. Mater. Sci., 35, 2451, 2000

Identifiers

DOI

10.12693/APhysPolA.101.781