Study of the thermal stability of Zerodur glass ceramics suitable for a scanning probe microscope frame

• Authors: Ondřej Číp , Radek Šmíd , Martin Čížek , Zdeněk Buchta , Josef Lazar
• Languages of publication: EN

Abstracts

EN

The work presents measurements of the length stability of Zerodur glass ceramic with temperature change. Measurement of this thermal characteristic is necessary for determination of the optimal temperature at which the Zerodur glass ceramic has a coefficient of thermal expansion close to zero. The principle of the measurement is to monitor the length changes using an optical resonator with a cavity mirror spacer made from the Zerodur material to be studied. The resonator is placed inside a vacuum chamber with a temperature control. A tunable laser diode is locked to a certain optical mode of the resonator to monitor the optical frequency of this mode. A beat-note signal from optical mixing between the laser and a stabilized femtosecond frequency comb is detected and processed. The temperature dependence of the glass ceramics was determined and analyzed. The resolution of the length measurement of the experimental set-up is on the order of 0.1 nm.

Keywords

EN

optical frequency synthesizer; optical resonator; ultra low-expansion material; dilatation

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2012
• Volume: 10
• Issue: 2
• Pages: 447-453

Dates

published

1 - 4 - 2012

online

31 - 3 - 2012

Contributors

author

Ondřej Číp

• Institute of Scientific Instruments of the ASCR, v.v.i. Academy of Sciences of the Czech Republic, Královopolská 147, 612 64, Brno, Czech Republic

author

Radek Šmíd

• Institute of Scientific Instruments of the ASCR, v.v.i. Academy of Sciences of the Czech Republic, Královopolská 147, 612 64, Brno, Czech Republic

author

Martin Čížek

• Institute of Scientific Instruments of the ASCR, v.v.i. Academy of Sciences of the Czech Republic, Královopolská 147, 612 64, Brno, Czech Republic

author

Zdeněk Buchta

• Institute of Scientific Instruments of the ASCR, v.v.i. Academy of Sciences of the Czech Republic, Královopolská 147, 612 64, Brno, Czech Republic

author

Josef Lazar

• Institute of Scientific Instruments of the ASCR, v.v.i. Academy of Sciences of the Czech Republic, Královopolská 147, 612 64, Brno, Czech Republic

References

• [1] H. Bach and D. Krause (Ed.), Low thermal expansion glass ceramics, 2nd edition (Springer-Verlag, Berlin Heidelberg, 2005)
• [2] O. Lindig, W. Pannhorst, Appl. Optics 24, 3330 (1985) http://dx.doi.org/10.1364/AO.24.003330[Crossref]
• [3] J. H. Burge, T. Peper, S. F. Jacobs, Appl. Optics 38, 7161 (1999)
• [4] S. T. Cundiff, J. Ye, Rev. Mod. Phys. 75, 325 (2003) http://dx.doi.org/10.1103/RevModPhys.75.325[Crossref]
• [5] R. ŠmÍd et al., 17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, Sep. 6–10, 2010, Janska Dolina, Slovakia (SPIE, 2010) 77460I
• [6] J. Oulehla et al., Optical Measurement Systems for Industrial Inspection VII, May. 22–26, 2011, Munich, Germany (SPIE, 2011) 80823Q
• [7] H. R. Telle et al., Appl. Phys. B 69, 327 (1999) http://dx.doi.org/10.1007/s003400050813[Crossref]
• [8] M. Bellini, T. W. Haensch, Opt. Lett. 25, 1049 (2000) http://dx.doi.org/10.1364/OL.25.001049[Crossref]
• [9] J. K. Ranka, R. S. Windeler, A. J. Stentz, Opt. Lett. 25, 25 (2000) http://dx.doi.org/10.1364/OL.25.000025[Crossref]
• [10] R. Šmíd, O. Číp, J. Lazar, Meas. Sci. Rev. 8, 114 (2008) http://dx.doi.org/10.2478/v10048-008-0027-6[Crossref]
• [11] R. Šmíd, O. Číp, M. Čížek, B. Mikel, J. Lazar, IEEE T. Ultrason. Ferr. 57, 636 (2010) http://dx.doi.org/10.1109/TUFFC.2010.1459[Crossref]
• [12] K. Nakagawa, M. de Labachelerie, Y. Awaji, M. Kourogi, J. Opt. Soc. Am. B 13, 2708 (1996) http://dx.doi.org/10.1364/JOSAB.13.002708[Crossref]
• [13] I. Mitra et al., Emerging Lithographic Technologies VIII, Feb. 24–26, 2004, Santa Clara, California, USA (SPIE, Bellingham, USA, 2004) 96
• [14] J. Ye, J. L. Hall, S. A. Diddams, Opt. Lett. 25, 1675 (2000) http://dx.doi.org/10.1364/OL.25.001675[Crossref]
• [15] W. Liu, J. J. Talghader, Appl. Optics 41, 3285 (2002) http://dx.doi.org/10.1364/AO.41.003285[Crossref]

Identifiers

DOI

10.2478/s11534-011-0112-6