Characterization of the surface topography and nano-hardness of Cu/Ni multilayer structures

• Authors: Edyta Kulej , Barbara Kucharska , Grzegorz Pyka , Monika Gwoździk
• Languages of publication: EN

Abstracts

EN

This article describes the results of a study of Cu/Ni multilayer coatings applied on a monocrystalline Si(100) silicon substrate by the deposition magnetron sputtering technique. Composed of 100 bilayers each, the multilayers were differentiated by the Ni sublayer thickness (1.2 to 3 nm), while maintaining the constant Cu sublayer thickness (2 nm). The multilayer coatings were characterized by assessing their surface topography using atomic force microscopy and their mechanical properties with nano-hardness measurements by the Berkovich method. The tests showed that the hardness of multilayers was substantially influenced by the thickness ratio of Cu and Ni sublayers and by surface roughness. The highest hardness and, at the same time, the lowest roughness was exhibited by a multilayer structure with a Cu-to-Ni sublayer thickness ratio of 2:1.5.

Keywords

EN

Cu/Ni multilayer; nanohardness; atomic force microscopy

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2011
• Volume: 9
• Issue: 6
• Pages: 1421-1425

Dates

published

1 - 12 - 2011

online

15 - 10 - 2011

Contributors

author

Edyta Kulej

• Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200, Czestochowa, Poland

author

Barbara Kucharska

• Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200, Czestochowa, Poland

author

Grzegorz Pyka

• Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, B-3001, Heverlee, Belgium

author

Monika Gwoździk

• Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200, Czestochowa, Poland

References

• [1] N. T. Loux, N. Savage, Water Air Soil. Poll. 194, 227 (2008) http://dx.doi.org/10.1007/s11270-008-9712-1[Crossref]
• [2] C. A. Huang, C. Y. Chen, C. C. Hsu, C. S. Lin, Scripta Mater. 57, 61 (2007) http://dx.doi.org/10.1016/j.scriptamat.2007.02.004[Crossref]
• [3] D. Cheng, Z. Y. Yan, L. Yan, Thin Solid Films 515, 3698 (2007) http://dx.doi.org/10.1016/j.tsf.2006.10.001[Crossref]
• [4] L. L. Hinchey, D. L. Mills, Phys. Rev. B 33, 3329 (1986) http://dx.doi.org/10.1103/PhysRevB.33.3329[Crossref]
• [5] K. Sakaue, N. Sano, H. Terauchi, A. Yoshihara, J. Cryst. Growth 150, 1154 (1995) http://dx.doi.org/10.1016/0022-0248(95)80120-2[Crossref]
• [6] M. N. Baibich, J. M. Broto, A. Fert, F. N. Van Dau, F. Petroff, P. Etienne, G. Creuzet, A. Friederich, J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988) http://dx.doi.org/10.1103/PhysRevLett.61.2472[Crossref]
• [7] G. H. Yang, B. Zhao, Y. Gao, F. Pan, Surf. Coat. Tech. 191, 127 (2005) http://dx.doi.org/10.1016/j.surfcoat.2004.02.006[Crossref]
• [8] H. C. Barsilia, K. S. Rajam, Surf. Coat. Tech. 155, 195 (2002) http://dx.doi.org/10.1016/S0257-8972(02)00008-7[Crossref]
• [9] B. Kucharska, E. Kulej, J. Kanak, Sol. St. Phen. Vol. 163, 291 (2010) http://dx.doi.org/10.4028/www.scientific.net/SSP.163.291[Crossref]
• [10] T. Stobiecki, M. Kopcewicz, F. J. Castaño, Solitons and Fractals 10, 2031 (1999) http://dx.doi.org/10.1016/S0960-0779(98)00252-5[Crossref]
• [11] A. Tokarz, A. Wolkenberg, A. Bochenek, Z. Nitkiewicz, A. Łaszcz, H. Wrzesinska, T. Przesławski, Composites 1, 2 (2001) (in Polish)
• [12] X. Y. Zhu, X. J. Liu, R. L. Zong, F. Zeng, F. Pan, Mater. Sci. Eng. A 527, 1243 (2010) http://dx.doi.org/10.1016/j.msea.2009.09.058[Crossref]
• [13] B. Kucharska, E. Kulej, M. Witkowska, Z. Nitkiewicz, Inzynieria Materiałowa 175, 439 (2010)

Identifiers

DOI

10.2478/s11534-011-0055-y