Discrete angle rotations of Bi nanoparticles embedded in a Ga matrix

• Authors: Avraham Be’er , Richard Kofman , Yossi Lereah
• Languages of publication: EN

Abstracts

EN

Spontaneous instabilities of nanoparticles are known to be influenced by the temperature, and strongly depend on the particle size. However, it is not clear what is the role of the surrounding material that is in contact with the particle. Here we report on the difference between spontaneous rotations of Bi nanoparticles embedded in amorphous SiO and those embedded in liquid Ga. The phenomenon was studied quantitatively by time resolved transmission electron microscopy using Fourier Transform analysis of highresolution electron microscopy images. While rotations of Bi nanoparticles embedded in amorphous SiO occur by all angles, the rotations of Bi nanoparticles embedded in liquid Ga occur by discrete angles. Our results point quantitatively, for the first time, to the role and importance of the contacting surrounding surface during the rotation of nanoparticles.

Keywords

EN

transmission electron microscopy; instabilities of nanoparticles

Discipline

• 68.: Surfaces and interfaces; thin films and nanosystems (structure and nonelectronic properties)(for surface and interface chemistry, see 82.65.+r, for surface magnetism, see 75.70.Rf)
• 61.46.-w: Structure of nanoscale materials(for thermal properties of nanocrystals and nanotubes, see 65.80.-g; for mechanical properties of nanoscale systems, see 62.25.-g; for electronic transport in nanoscale materials, see 73.63.-b; see also 62.23.-c Structural classes of nanoscale systems; 64.70.Nd Structural transitions in nanoscale materials; for magnetic properties of nanostructures, see 75.75.-c)
• 61.46.Df: Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)
• 61.66.-f: Structure of specific crystalline solids(for surface structure, see 68.35.B-)

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2010
• Volume: 8
• Issue: 1
• Pages: 1-6

Dates

published

1 - 2 - 2010

online

15 - 11 - 2009

Contributors

author

Avraham Be’er

• Department of Physical Electronics, Faculty of Engineering, Tel-Aviv University, Tel-Aviv, 69978, Israel

author

Richard Kofman

• Laboratoire de Physique de la Matiere Condensee, Unite Associee au CNRS 6622, Universite de Nice, Parc Valrose, 06108, Nice Cedex 2, France

author

Yossi Lereah

• Department of Physical Electronics, Faculty of Engineering, Tel-Aviv University, Tel-Aviv, 69978, Israel

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Identifiers

DOI

10.2478/s11534-009-0063-3