Structural, morphology and electrical properties of layered copper selenide thin film

• Authors: J. Ying Chyi Liew , Zainal Talib , W. Mahmood , M. Yunus , Zulkarnain Zainal , Shaari Halim , Mohd Moksin , Wan Yusoff , K. Pah Lim
• Languages of publication: EN

Abstracts

EN

Thin films of copper selenide (CuSe) were physically deposited layer-by-layer up to 5 layers using thermal evaporation technique onto a glass substrate. Various film properties, including the thickness, structure, morphology, surface roughness, average grain size and electrical conductivity are studied and discussed. These properties are characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), ellipsometer and 4 point probe at room temperature. The dependence of electrical conductivity, surface roughness, and average grain size on number of layers deposited is discussed.

Keywords

EN

CuSe thin films; electrical conductivity; surface roughness; film thickness; grain size

Discipline

• 71.20.Nr: Semiconductor compounds
• 72.20.-i: Conductivity phenomena in semiconductors and insulators(see also 66.70.-f Nonelectronic thermal conduction and heat-pulse propagation in solids; thermal waves)
• 73.21.Ac: Multilayers
• 73.25.+i: Surface conductivity and carrier phenomena
• 73.50.-h: Electronic transport phenomena in thin films(for electronic transport in mesoscopic systems, see 73.23.-b; see also 73.40.-c Electronic transport in interface structures; for electronic transport in nanoscale materials and structures, see 73.63.-b)

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2009
• Volume: 7
• Issue: 2
• Pages: 379-384

Dates

published

1 - 6 - 2009

online

26 - 4 - 2009

Contributors

author

J. Ying Chyi Liew

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

Zainal Talib

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

W. Mahmood

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

M. Yunus

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

Zulkarnain Zainal

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

Shaari Halim

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

Mohd Moksin

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

Wan Yusoff

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

author

K. Pah Lim

• Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

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Identifiers

DOI

10.2478/s11534-009-0057-1