Determination of thin film refractive index and thickness by means of film phase thickness

• Authors: Milen Nenkov , Tamara Pencheva
• Languages of publication: EN

Abstracts

EN

A new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

Keywords

EN

thin films; refractive index; barium titanate

Discipline

• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)
• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2008
• Volume: 6
• Issue: 2
• Pages: 332-343

Dates

published

1 - 6 - 2008

online

26 - 3 - 2008

Contributors

author

Milen Nenkov

• Physics Department, University of Rousse, 7017, Rousse, Bulgaria

author

Tamara Pencheva

• Physics Department, University of Rousse, 7017, Rousse, Bulgaria

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Identifiers

DOI

10.2478/s11534-008-0035-z