Textured nickel tapes prepared from commercially available material

• Authors: Oliver Staller , Dietmar Holzmann , Gerhard Gritzner , Pavel Diko , Daniel Mikolaj , František Kováč
• Languages of publication: EN

Abstracts

EN

Textured Ni tapes were fabricated from commercially available nickel pellets (98.5% Ni). Ingots produced by a melt process were cold rolled to 150–400 μm thick tapes. Texturing was achieved by annealing in a reducing atmosphere (Ar + 6.5% v/v H2). Sharp cubic biaxial textured Ni tapes were obtained by thermal treatment at 1000°C for 2 hours in a reducing atmosphere. The tapes were characterized by scanning electron microscopy, X-ray diffraction and by electron backscattering diffraction. The tensile strength, the thermal expansion behavior and the Vickers hardness for the cold rolled tapes and for the heat-treated tapes were measured. [...]

Keywords

EN

Coated conductors; Textured Ni tapes; Tensile strength; Texture

• Publisher: De Gruyter Open
• Journal: Open Chemistry
• Year: 2008
• Volume: 6
• Issue: 2
• Pages: 135-139

Dates

published

1 - 6 - 2008

online

17 - 4 - 2008

Contributors

author

Oliver Staller

• Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University, A-4040, Linz, Austria

author

Dietmar Holzmann

• Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University, A-4040, Linz, Austria

author

Gerhard Gritzner

• Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University, A-4040, Linz, Austria

author

Pavel Diko

• Institute of Experimental Physics, Slovak Academy of Sciences, Watsonova 47, 04001, Košice, Slovakia

author

Daniel Mikolaj

• Institute of Materials Science, Slovak Academy of Sciences, Watsonova 47, 04001, Košice, Slovakia

author

František Kováč

• Institute of Materials Science, Slovak Academy of Sciences, Watsonova 47, 04001, Košice, Slovakia

References

• [1] D.P. Norton, A. Goyal, J.D. Budai, D. Christen, D.K. Kroeger, E.D. Specht, Q. He, B. Saffian, M. Paranthaman, C.E. Klabunde, D.F. Lee, B.C. Sales, F.A. List, Science 274, 755 (1996) http://dx.doi.org/10.1126/science.274.5288.755[Crossref]
• [2] T.G. Woodcock, J.S. Abell, T.C. Shields, M.G. Hall, Physica C 372-376 (SUPPL. 2), 863 (2002) http://dx.doi.org/10.1016/S0921-4534(02)00874-2[Crossref]
• [3] J. Eikemeyer, D. Selbmann, R. Opitz, B. de Boer, B. Holzapfel, L. Schultz, U. Miller, Supercond. Sci. Technol. 14, 152 (2001) http://dx.doi.org/10.1088/0953-2048/14/3/306[Crossref]
• [4] J. Eikemeyer, D. Selbmann, H. Wendrock, A. Güth, B. Holzapfel, Supercond. Sci. Technol. 18, 770 (2005) http://dx.doi.org/10.1088/0953-2048/18/5/033[Crossref]
• [5] A. Goyal, R. Feenstra, M. Paranthaman, J.R. Thompson, B.Y. Kang, C. Cantoni, D.F. Lee, F.A. List, P.M. Martin, E. Lara-Curzio, C. Stevens, D.M. Kroeger, M. Kowalewski, E.D. Specht, T. Aytug, S. Sathyamurthy, R.K. Williams, R.E. Ericson, Physica C 382, 251 (2002) http://dx.doi.org/10.1016/S0921-4534(02)00626-3[Crossref]
• [6] K.J. Leonare, A. Goyal, S. Kang, K.A. Yarborough, D.M. Kroeger, Supercond. Sci. Technol. 17, 1295 (2004) http://dx.doi.org/10.1088/0953-2048/17/11/010[Crossref]
• [7] A. Vannozzi, A. Rufoloni, G. Celentano, A. Augieri, L. Ciontea, F. Fabbri, U. Galluzzi, A. Mancini, T. Petrisor, Supercond. Sci. Technol. 19, 1240 (2006) http://dx.doi.org/10.1088/0953-2048/19/12/003[Crossref]
• [8] J. Eikemeyer, D. Selbmann, R. Opitz, H. Wendrock, E. Maher, U. Miller, W. Prusseit, Physica C 372-376, 814 (2002) http://dx.doi.org/10.1016/S0921-4534(02)00914-0[Crossref]
• [9] K.T. Kim, J.H. Lim, J.H. Kim, J. Joo, W. Nah, B.K. Ji, B-H. Jun, C-J. Kim, G-W. Hong, Physica C 463-465, 604 (2004) http://dx.doi.org/10.1016/j.physc.2007.04.258[Crossref]
• [10] K. Knoth, B. Schlobach, R. Hühne, L. Schultz, B. Holzapfel, Physica C 426-431, 979 (2005) http://dx.doi.org/10.1016/j.physc.2005.03.077[Crossref]
• [11] P.P. Bhattachacharjee, R.K. Ray, A. Upadhyaya, Physica C 449, 116 (2006) http://dx.doi.org/10.1016/j.physc.2006.07.009[Crossref]
• [12] C.C. Clickner, J.W. Ekin, N. Cheggour, C.L.H. Thieme, Y. Qiao, Y.Y. Xie, A. Goyal Cryogenics 46, 432 (2006) http://dx.doi.org/10.1016/j.cryogenics.2006.01.014[Crossref]
• [13] Ullmann’s Encyclopedia of Industrial Chemistry, 5th edition (VCH Verlagsgesellschaft mbH Weinheim, Germany)
• [14] I.D. Corrick, Nickel Mineral Commodity Profiles, U.S. Bureau of Mines ( Washington, D.C., 1979)
• [15] M.D. Head, V.A. Englesakis, B.C. Pearson, D.H. Wilkinson, 105th TMS-AIME Annual Meeting, 1976, Las Vegas, USA
• [16] J.R. Boldt, P.E. Queneau, The Winning of Nickel (Longmans Canada, Toronto 1967)
• [17] C.V. Varanasi, P.N. Bes, N.A. Yust, Supercond. Sci. Technol. 19, 85 (2006) http://dx.doi.org/10.1088/0953-2048/19/1/015[Crossref]
• [18] D. Dimos, P. Chaudhari, Mannhart, J. Phys. Rev. B 41, 4038 (1990) http://dx.doi.org/10.1103/PhysRevB.41.4038[Crossref]
• [19] K. Matsumoto, A. Takechi, T. Ono, I. Hirabayashi, K. Osamura, Physica C 392-369, 830 (2003) http://dx.doi.org/10.1016/S0921-4534(03)01205-X[Crossref]
• [20] K.E. Volk, Nickel und Nickellegierungen (Springer Verlag, Berlin, Germany, 1970) (in German)
• [21] W. Betteridge, Nickel and its Alloys (MacDonald and Evans Ltd., Plymouth, United Kingdom, 1977)
• [22] C.J. Smithells, Metals Reference Book, 5th edition (Butterworths, London, 1976)

Identifiers

DOI

10.2478/s11532-008-0013-8