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Flash memory cells data loss caused by total ionizing dose and heavy ions

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Petrov A., Vasil’ev A., Ulanova A., Chumakov A., Nikiforov A.
Open Physics
|
2014
|
vol. 12
|
issue 10
725-729
EN
The paper provides experimental results of flash memory loss data investigation. Possible mechanisms of charge loss from storage element are reviewed. We provide some guidelines for flash memory evaluation to space application.
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