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Journals
2
Metrology and Measurement Systems
1
International Journal of Electronics and Telecommunications
Years
1
2020
1
2019
1
2013
Authors
1
Brachmański S.
1
Grmela L.
1
Kin M.
1
Majzner J.
1
Ouyang Q.
1
Sedlak P.
1
Sedlakova V.
1
Shao Z.
1
Sikula J.
1
Sita Z.
1
Wu J.
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Full text local access
Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors
100%
Grmela L.
,
Sita Z.
,
Sedlakova V.
,
Majzner J.
,
Sedlak P.
,
Sikula J.
Metrology and Measurement Systems
|
2013
|
issue
4
2
Full text local access
Quality Assessment of Musical and Speech Signals Broadcasted via Single Frequency Network DAB+
86%
Kin M.
,
Brachmański S.
,
Kin M.
,
Brachmański S.
|
2020
|
vol.
66
|
issue
1
3
Full text local access
An objective quality evaluation method for haptic rendering system: taking hardness rendering as an example
86%
Shao Z.
,
Wu J.
,
Ouyang Q.
,
Shao Z.
,
Wu J.
,
Ouyang Q.
Metrology and Measurement Systems
|
2019
|
vol.
26
|
issue
3
Page
/ 1
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