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Journals
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Bulletin of the Polish Academy of Sciences: Technical Sciences
1
Metrology and Measurement Systems
Years
1
2020
1
2013
Authors
1
Júnior P. A. A. M.
1
Kucharski D.
1
Magalhães C. A.
1
Neto P. S.
1
Zdunek H.
1
de Barcellos C. S.
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Full text local access
A low-cost, simple optical setup for a fast scatterometry surface roughness measurements with nanometric precision
100%
Kucharski D.
,
Zdunek H.
,
Kucharski D.
,
Zdunek H.
Bulletin of the Polish Academy of Sciences: Technical Sciences
|
2020
2
Full text local access
Separation of Isochromatics and Isoclinics Phasemaps for the Photoelastic Technique with use Phase Shifting and a Large Number of High Precision Images
84%
Magalhães C. A.
,
Neto P. S.
,
Júnior P. A. A. M.
,
de Barcellos C. S.
Metrology and Measurement Systems
|
2013
|
issue
1
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/ 1
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