We present an overview of design approaches for nanometrology measuring setups with a focus on interferometry techniques and associated problems. The design and development of a positioning system with interferometric multiaxis monitoring and control is presented. The system is intended to operate as a national nanometrology standard combining local probe microscopy techniques and sample position control with traceability to the primary standard of length.
The morphology and structure of thin films containing chitosan (Ch) with montmorillonite (MMT) were characterised by scanning electron microscopy (SEM), atomic force microscopy (AFM) and attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR). Thin films of two chitosan samples and a composition of chitosan with montmorillonite were formed by casting methods from acetic acid solutions and were soaked in a simulated body fluid (SBF) solution at 37C for 14 days. The samples were compared before and after soaking. The obtained results showed growth of new phases containing calcium in all prepared films.
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