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Ellipsometric and Spectrophotometric Investigations of Porous Silica Thin Films Produced by Sol-Gel Method

100%
Skoczek E., Jaglarz J., Karasiński P.
Acta Physica Polonica A
|
2011
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vol. 120
|
issue 4
732-735
EN
The work presents the optical properties of porous silica thin films prepared by TEOS sol-gel method. The films were deposited onto glass substrate using dip-coating technique. The spectroscopic ellipsometry measurements have been performed to determine the optical constants of the films. This technique also enabled evaluation of the depolarization for the investigated layers. Additionally, the spectrophotometric measurements of transmittance and reflectance by the use of integrating sphere and reflectance probe have been made with the aim of possible application of the films as antireflective coatings.
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Luminescence of Lanthanides from Xerogels Embedded in Mesoporous Matrices

63%
Gaponenko N.
Acta Physica Polonica A
|
2007
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vol. 112
|
issue 5
737-749
EN
The report summarizes peculiarities of synthesis and luminescence properties of porous silicon, porous anodic alumina and artificial opals with the inclusions of sol-gel derived oxides (xerogels), doped with Er, Tb, and Eu. Origin of strong luminescence of lanthanides from xerogels in mesoporous matrices is discussed.
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